Conference Paper
Reithmeier, M.; Erbe, A.: Antireflective Layers on Thin Metal Films for Mid-Infrared Internal Reflection Spectroscopy. In: Optical Interference Coatings (OIC), pp. 1 - 3. Measurement III (ThE), Tucson, AZ, USA, June 06, 2010. Optical Society of America (OSA), Washington, D.C., USA (2010)