Kobayashi, S.; Zaefferer, S.: Microstructure Control Using Phase Transformations in Ternary Gamma TiAl Alloys. Seminar talk, Universität Kassel, Kassel Germany (2006)
Zaefferer, S.: 3D-orientation microscopy in a FIB-SEM: A new dimension of microstructure characterization. 13th Conference on Electron Backscatter Diffraction, Oxford, UK (2006)
Bastos, A.; Zaefferer, S.; Raabe, D.: Orientation microscopy on electrodeposited samples. 13th Conference and Workshop on Electron Backscatter Diffraction, Oxford, UK (2006)
Bastos, A.; Zaefferer, S.; Raabe, D.: Characterization of microstructure and Texture of nanostructure electrodeposited NiCo samples by use of Electron Backscatter Diffraction (EBSD). DPG – Spring meeting, Dresden, Germany (2006)
Kobayashi, S.; Zaefferer, S.: Optimisation of Precipitation for the Development of Heat Resistant Fe3Al-based Alloys. Seminar talk, National Institute for Materials Science (NIMS), Tsukuba, Japan (2006)
Zaefferer, S.: Application of orientation microscopy in SEM and TEM for the study of texture formation during recrystallisation processes. Materials Science Seminar, Institute for Materials Science, Krakow, Poland (2005)
Zaefferer, S.: Möglichkeiten und Grenzen der Orientierungsmikroskopie mittels EBSD im Rasterelektronenmikroskop. Werkstoffausschuss & Unterausschuss für Metallographie, Werkstoffanalytik und -simulation des VdeH, Düsseldorf (2005)
Dorner, D.; Lahn, L.; Zaefferer, S.; Raabe, D.: Fundamental Research on Microstructure and Microtexture Development in Grain-oriented Silicon Steel: The Evolution of the Goss orientation. 17th Soft Magnetic Materials Conference (SMM17), Bratislava, Slovakia (2005)
Sato, H.; Zaefferer, S.: A study on the crystal orientation relationship of butterfly martensite in an Fe30 % Ni alloy by 3-D EBSD-based orientation microscopy. Microscopy Conference 2005, Davos, Switzerland (2005)
Zaefferer, S.; Konrad, J.; Raabe, D.: 3D-Orientation Microscopy in a Combined Focused Ion Beam (FIB) - Scanning Electron Microscope: A New Dimension of Microstructure Characterisation. Microscopy Conference 2005, Davos, Switzerland (2005)
Bastos da Silva, A. F.; Raabe, D.; Zaefferer, S.: Experiments on the local mechanics and texture evolution of nanocrystalline Nickel. 14th International Conference on Textures of Materials (ICOTOM 14), Leuven, Belgium (2005)
Zaefferer, S.: Application of orientation microscopy in SEM and TEM for the study of texture formation during recrystallisation processes. 14th International Conference on Textures of Materials (ICOTOM 14), Leuven, Belgium (2005)
Bastos, A.; Zaefferer, S.; Raabe, D.: Characterization of Nanostructured Electrodeposited NiCo Samples by use of Electron Backscatter Diffraction (EBSD). Conference on Textures of Materials ICOTOM 14, Leuven, Belgium (2005)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Crystal Plasticity (CP) modeling [1] is a powerful and well established computational materials science tool to investigate mechanical structure–property relations in crystalline materials. It has been successfully applied to study diverse micromechanical phenomena ranging from strain hardening in single crystals to texture evolution in…
Complex simulation protocols combine distinctly different computer codes and have to run on heterogeneous computer architectures. To enable these complex simulation protocols, the CM department has developed pyiron.
Statistical significance in materials science is a challenge that has been trying to overcome by miniaturization. However, this process is still limited to 4-5 tests per parameter variance, i.e. Size, orientation, grain size, composition, etc. as the process of fabricating pillars and testing has to be done one by one. With this project, we aim to…
Atom probe tomography (APT) provides three dimensional(3D) chemical mapping of materials at sub nanometer spatial resolution. In this project, we develop machine-learning tools to facilitate the microstructure analysis of APT data sets in a well-controlled way.