Zaefferer, S.: 3D-orientation microscopy in a FIB-SEM: A new dimension of microstructure characterization. 13th Conference on Electron Backscatter Diffraction, Oxford, UK (2006)
Bastos, A.; Zaefferer, S.; Raabe, D.: Orientation microscopy on electrodeposited samples. 13th Conference and Workshop on Electron Backscatter Diffraction, Oxford, UK (2006)
Bastos, A.; Zaefferer, S.; Raabe, D.: Characterization of microstructure and Texture of nanostructure electrodeposited NiCo samples by use of Electron Backscatter Diffraction (EBSD). DPG – Spring meeting, Dresden, Germany (2006)
Kobayashi, S.; Zaefferer, S.: Optimisation of Precipitation for the Development of Heat Resistant Fe3Al-based Alloys. Seminar talk, National Institute for Materials Science (NIMS), Tsukuba, Japan (2006)
Zaefferer, S.: Application of orientation microscopy in SEM and TEM for the study of texture formation during recrystallisation processes. Materials Science Seminar, Institute for Materials Science, Krakow, Poland (2005)
Zaefferer, S.: Möglichkeiten und Grenzen der Orientierungsmikroskopie mittels EBSD im Rasterelektronenmikroskop. Werkstoffausschuss & Unterausschuss für Metallographie, Werkstoffanalytik und -simulation des VdeH, Düsseldorf (2005)
Dorner, D.; Lahn, L.; Zaefferer, S.; Raabe, D.: Fundamental Research on Microstructure and Microtexture Development in Grain-oriented Silicon Steel: The Evolution of the Goss orientation. 17th Soft Magnetic Materials Conference (SMM17), Bratislava, Slovakia (2005)
Sato, H.; Zaefferer, S.: A study on the crystal orientation relationship of butterfly martensite in an Fe30 % Ni alloy by 3-D EBSD-based orientation microscopy. Microscopy Conference 2005, Davos, Switzerland (2005)
Zaefferer, S.; Konrad, J.; Raabe, D.: 3D-Orientation Microscopy in a Combined Focused Ion Beam (FIB) - Scanning Electron Microscope: A New Dimension of Microstructure Characterisation. Microscopy Conference 2005, Davos, Switzerland (2005)
Bastos da Silva, A. F.; Raabe, D.; Zaefferer, S.: Experiments on the local mechanics and texture evolution of nanocrystalline Nickel. 14th International Conference on Textures of Materials (ICOTOM 14), Leuven, Belgium (2005)
Zaefferer, S.: Application of orientation microscopy in SEM and TEM for the study of texture formation during recrystallisation processes. 14th International Conference on Textures of Materials (ICOTOM 14), Leuven, Belgium (2005)
Bastos, A.; Zaefferer, S.; Raabe, D.: Characterization of Nanostructured Electrodeposited NiCo Samples by use of Electron Backscatter Diffraction (EBSD). Conference on Textures of Materials ICOTOM 14, Leuven, Belgium (2005)
Dorner, D.; Lahn, L.; Zaefferer, S.: Survival of Goss grains during cold rolling of a silicon steel single crystal. 14th International Conference on the Texture of Materials (ICOTOM14), Leuven, Belgium (2005)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Integrated Computational Materials Engineering (ICME) is one of the emerging hot topics in Computational Materials Simulation during the last years. It aims at the integration of simulation tools at different length scales and along the processing chain to predict and optimize final component properties.
Data-rich experiments such as scanning transmission electron microscopy (STEM) provide large amounts of multi-dimensional raw data that encodes, via correlations or hierarchical patterns, much of the underlying materials physics. With modern instrumentation, data generation tends to be faster than human analysis, and the full information content is…
The project’s goal is to synergize experimental phase transformations dynamics, observed via scanning transmission electron microscopy, with phase-field models that will enable us to learn the continuum description of complex material systems directly from experiment.
In order to prepare raw data from scanning transmission electron microscopy for analysis, pattern detection algorithms are developed that allow to identify automatically higher-order feature such as crystalline grains, lattice defects, etc. from atomically resolved measurements.