Johansen, M.; Singh, M. P.; Xu, J.; Asp, L. E.; Gault, B.; Liu, F.: Unravelling lithium distribution in carbon fibre electrodes for structural batteries with atom probe tomography. Carbon 225, 119091 (2024)
Woods, E.; Singh, M. P.; Kim, S.-H.; Schwarz, T.; Douglas, J. O.; El-Zoka, A.; Giulani, F.; Gault, B.: A versatile and reproducible cryo-sample preparation methodology for atom probe studies. Microscopy and Microanalysis, ozad120 29 (6), pp. 1992 - 2003 (2023)
Singh, M. P.; Woods, E.; Kim, S.-H.; Jung, C.; Aota, L. S.; Gault, B.: Facilitating the Systematic Nanoscale Study of Battery Materials by Atom Probe Tomography through in-situ Metal Coating. Batteries & Supercaps 7 (2), e202300403 (2023)
Woods, E.; Aota, L. S.; Schwarz, T.; Kim, S.-H.; Douglas, J. O.; Singh, M. P.; Gault, B.: In-situ cryogenic protective layers and metal coatings in cryogenic FIB. IMC20 - 20th International Microscopy Congress - Pre-congress workshop, Cryogenic Atom Probe Tomography, Busan, South Korea (2023)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
Within this project, we will use a green laser beam source based selective melting to fabricate full dense copper architectures. The focus will be on identifying the process parameter-microstructure-mechanical property relationships in 3-dimensional copper lattice architectures, under both quasi-static and dynamic loading conditions.
Oxides find broad applications as catalysts or in electronic components, however are generally brittle materials where dislocations are difficult to activate in the covalent rigid lattice. Here, the link between plasticity and fracture is critical for wide-scale application of functional oxide materials.
The fracture toughness of AuXSnY intermetallic compounds is measured as it is crucial for the reliability of electronic chips in industrial applications.
Within this project we investigate chemical fluctuations at the nanometre scale in polycrystalline Cu(In,Ga)Se2 and CuInS2 thin-flims used as absorber material in solar cells.