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Gault, B.: Can machine learning bring atom probe microscopy closer to analytical atomic-scale tomography. 12th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC 19), Kyoto, Japan (2019)

Kürnsteiner, P.; Cervellon, A.; Cormier, J.; Raabe, D.; Gault, B.; Kontis, P.: Understanding deformation mechanisms in superalloys through systematic atomic scale microanalysis. Journées Annuelles SF2M 2019, Paris, France (2019)

Lim, J.; Kim, S.-H.; Sahu, R.; Aymerich Armengol, R.; Kasian, O.; Choi, P.-P.; Stephenson, L.; Gault, B.; Scheu, C.: Detection of trace impurities and other defects in functional nanomaterials. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano 2019, Düsseldorf, Germany (2019)

Schweinar, K.; Nicholls, R. L.; Rajamathi, C. R.; Zeller, P.; Amati, M.; Gregoratti, L.; Raabe, D.; Greiner, M.; Gault, B.; Kasian, O.: Probing Catalytic Surfaces by Correlative Scanning Photoemission Electron Microscopy and Atom Probe Tomography. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano 2019 , Düsseldorf, Germany (2019)

Raabe, D.; Ponge, D.; Kwiatkowski da Silva, A.; Makineni, S. K.; Katnagallu, S.; Stephenson, L.; Kontis, P.; Freysoldt, C.; Neugebauer, J.; Gault, B.: Chemistry at Lattice Defects Probed at Atomic Scale. 20th International Union of Materials Research Societies International Conference in Asia IUMRS, Perth, Australia (2019)

Raabe, D.; Ponge, D.; Li, Z.; Neugebauer, J.; Körmann, F.; Rao, Z.; Gault, B.: Metastable High Entropy Alloys. World Congress on High Entropy Alloys, Seattle, WA, USA (2019)

Dubosq, R.; Gault, B.; Rogowitz, A.; Schweinar, K.; Zaefferer, S.; Schneider, D.: New Applications to Atom Probe Tomography: Insights on Trace Element Diffusion in Naturally Deformed Minerals. M & M 2019, Portland, OR, USA (2019)

Kasian, O.; Schweinar, K.; Cherevko, S.; Gault, B.; Mayrhofer, K. J. J.: Correlating Atomic Scale Structure with Reaction Mechanisms: Electrocatalytic Evolution of Oxygen. 70^th Annual Meeting of the International Society of Electrochemistry, Durban, South Africa (2019)

Kontis, P.; Lilensten, L.; Kürnsteiner, P.; Cervellon, A.; Cormier, J.; Raabe, D.; Gault, B.: The effect of segregation of solutes at crystal defects on the mechanical performance of superalloys. 10th Pacific Rim International Conference on Advance Materials and Processing (PRICM-10), Xi'an, China (2019)

Kürnsteiner, P.; Hariharan, A.; Jung, H. Y.; Peter, N. J.; Wilms, M. B.; Weisheit, A.; Barriobero-Vila, P.; Gault, B.; Raabe, D.; Jägle, E. A.: Application of Atom Probe Tomography to Complex Microstructures of Laser Additively Manufactured Samples. Microscopy & Microanalysis Conference, Portland, OR, USA (2019)

Schweinar, K.; Kasian, O.; Nicholls, R. L.; Rajamathi, C. R.; Zeller, P.; Amati, M.; Gregoratti, L.; Raabe, D.; Greiner, M. T.; Gault, B.: An Integrated Workflow to Investigate Electrocatalytic Surfaces by Correlative X-ray Photoemission Spectroscopy, Scanning Photoemission Electron Microscopy and Atom Probe Tomography. M & M 2019 : Microscopy & Microanalysis 2019, Portland, OR, USA (2019)

Stephenson, L.; Katnagallu, S.; Mouton, I.; Oliveira, F.; Gault, B.; Raabe, D.: An Atomic Renaissance for Pulsed Field Ion Microscopy. Microscopy & Microanalysis 2019, Portland, OR, USA (2019)

Gault, B.: An introduction to atom probe tomography: from fundamentals to atomic-scale insights into engineering materials. Rolls Royce Lunchtime Seminar, Derby, UK (2019)

Gault, B.: Quantifying hydrogen by atom probe tomography. Seminar, Oxford University, Oxford, UK (2019)

Gault, B.: An introduction to atom probe tomography: from fundamentals to atomic-scale insights into engineering materials. Seminar, University of Manchester, Manchester, UK (2019)

Kwiatkowski da Silva, A.; Ponge, D.; Kamachali, R. D.; Gault, B.; Neugebauer, J.; Raabe, D.: Thermodynamics of Grain Boundary Segregation and Interfacial Spinodal: A CALPHAD-based Modeling Approach and Near-atomic Scale Characterization. CALPHAD XLVIII, Singapore, Singapore (2019)

Raabe, D.; Ponge, D.; Kwiatkowski da Silva, A.; Makineni, S. K.; Katnagallu, S.; Stephenson, L.; Kontis, P.; Wu, X.; Freysoldt, C.; Neugebauer, J. et al.; Gault, B.: Chemistry at Lattice Defects Probed at Atomic Scale. The 53rd Annual Meeting of the Israel Society for Microscopy, Tel Aviv, Israel, Tel Aviv, Israel (2019)

Raabe, D.; Ponge, D.; Kwiatkowski da Silva, A.; Makineni, S. K.; Katnagallu, S.; Stephenson, L.; Kontis, P.; Wu, X.; Freysoldt, C.; Neugebauer, J. et al.; Gault, B.: Interaction of Chemistry and Structure at Lattice Defects at Atomic Scale. Russell Berrie Nanotechnology Institute, Technion, Haifa, Israel, Haifa, Israel (2019)

Gault, B.: An introduction to atom probe tomography: from fundamentals to atomic-scale insights into engineering materials. Seminar, University of British Columbia, Vancouver, BC, Canada (2019)

Gault, B.: Some kind of introduction to atom probe tomography. Annual Meeting of the Canadian Society for Microscopy, Vancouver, BC, Canada (2019)