Harzer, T. P.; Duarte, M. J.; Dehm, G.: In–situ TEM study of diffusion kinetics and electron irradiation effects on the Cr phase separation of a nanocrystalline Cu–4 at.% Cr thin film alloy. Journal of Alloys and Compounds 695, pp. 1583 - 1590 (2017)
Harzer, T. P.; Dehm, G.: Stability, phase separation and oxidation of a supersaturated nanocrystalline Cu–33 at.% Cr thin film alloy. Thin Solid Films 623, pp. 48 - 58 (2017)
Brinckmann, S.; Kirchlechner, C.; Dehm, G.: Stress intensity factor dependence on anisotropy and geometry during micro-fracture experiments. Scripta Materialia 127, pp. 76 - 78 (2017)
Hodnik, N.; Dehm, G.; Mayrhofer, K. J. J.: Importance and Challenges of Electrochemical in Situ Liquid Cell Electron Microscopy for Energy Conversion Research. Accounts of Chemical Research 49 (9), pp. 2015 - 2022 (2016)
Philippi, B.; Kirchlechner, C.; Micha, J.-S.; Dehm, G.: Size and orientation dependent mechanical behavior of body-centered tetragonal Sn at 0.6 of the melting temperature. Acta Materialia 115, pp. 76 - 82 (2016)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
In this ongoing project, we investigate spinodal fluctuations at crystal defects such as grain boundaries and dislocations in Fe-Mn alloys using atom probe tomography, electron microscopy and thermodynamic modeling [1,2].
The aim of the Additive micromanufacturing (AMMicro) project is to fabricate advanced multimaterial/multiphase MEMS devices with superior impact-resistance and self-damage sensing mechanisms.
TiAl-based alloys currently mature into application. Sufficient strength at high temperatures and ductility at ambient temperatures are crucial issues for these novel light-weight materials. By generation of two-phase lamellar TiAl + Ti3Al microstructures, these issues can be successfully solved. Because oxidation resistance at high temperatures is…
We will investigate the electrothermomechanical response of individual metallic nanowires as a function of microstructural interfaces from the growth processes. This will be accomplished using in situ SEM 4-point probe-based electrical resistivity measurements and 2-point probe-based impedance measurements, as a function of mechanical strain and…