Salgin, B.; Rohwerder, M.: Mobility of Water and Charge Carriers in Polymer/Oxide/Aluminium Alloy Interphases. M2i/DPI Project Meeting, Delft, The Netherlands (2009)
Salgin, B.; Rohwerder, M.: A New Approach to Determine Ion Mobility Coefficients for Delamination Scenarios. electrochem09 and 50th Corrosion Science Symposium, Manchester, UK (2009)
Salgin, B.; Rohwerder, M.: A New Approach to Determine Ion Mobility Coefficients for Delamination Scenarios. 60th Annual Meeting of the International Meeting of the International Society of Electrochemistry, Beijing, China (2009)
Salgin, B.; Rohwerder, M.: Effects of Semiconducting Properties of Surface Oxide on the Delamination at the Polymer/Zinc Interface. SurMat Seminar, Kleve, Germany (2008)
Salgin, B.; Rohwerder, M.: Mobility of Water and Charge Carriers in Polymer/Oxide/Aluminium Alloy Interphases. M2i Conference 2011, Noordwijkerhout, The Netherlands (2011)
Salgin, B.; Rohwerder, M.: Scanning Kelvin Probe (SKP) as a tool for monitoring ion mobility on insulators. M2i Conference 2009, Noordwijkerhout, The Netherlands (2009)
Salgin, B.; Rohwerder, M.: Effects of the Semiconducting Properties of Surface Oxide on the Delamination at the Polymer/Metal Interface. 2nd International IMPRS-SurMat Workshop, Bochum, Germany (2008)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
The aim of the Additive micromanufacturing (AMMicro) project is to fabricate advanced multimaterial/multiphase MEMS devices with superior impact-resistance and self-damage sensing mechanisms.
TiAl-based alloys currently mature into application. Sufficient strength at high temperatures and ductility at ambient temperatures are crucial issues for these novel light-weight materials. By generation of two-phase lamellar TiAl + Ti3Al microstructures, these issues can be successfully solved. Because oxidation resistance at high temperatures is…
We will investigate the electrothermomechanical response of individual metallic nanowires as a function of microstructural interfaces from the growth processes. This will be accomplished using in situ SEM 4-point probe-based electrical resistivity measurements and 2-point probe-based impedance measurements, as a function of mechanical strain and…