Woods, E.; Singh, M. P.; Kim, S.-H.; Schwarz, T.; Douglas, J. O.; El-Zoka, A.; Giulani, F.; Gault, B.: A versatile and reproducible cryo-sample preparation methodology for atom probe studies. Microscopy and Microanalysis, ozad120 29 (6), pp. 1992 - 2003 (2023)
Schwarz, T.; Yu, W.; Zhan, H.; Gault, B.; Gourlay, C.; McCarroll, I.: Uncovering Ce-rich clusters and their role in precipitation strengthening of an AE44 alloy. Scripta Materialia 232, 115498 (2023)
Woods, E.; Aota, L. S.; Schwarz, T.; Kim, S.-H.; Douglas, J. O.; Singh, M. P.; Gault, B.: In-situ cryogenic protective layers and metal coatings in cryogenic FIB. IMC20 - 20th International Microscopy Congress - Pre-congress workshop, Cryogenic Atom Probe Tomography, Busan, South Korea (2023)
Schwarz, T.: Atom probe tomography: from water to complex liquids to the application of studying liquid-solid interfaces at the near atomic level. APT&M 23, Leuven, Belgium (2023)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
In this project we study the development of a maraging steel alloy consisting of Fe, Ni and Al, that shows pronounced response to the intrinsic heat treatment imposed during Laser Additive Manufacturing (LAM). Without any further heat treatment, it was possible to produce a maraging steel that is intrinsically precipitation strengthened by an…
The aim of the Additive micromanufacturing (AMMicro) project is to fabricate advanced multimaterial/multiphase MEMS devices with superior impact-resistance and self-damage sensing mechanisms.
TiAl-based alloys currently mature into application. Sufficient strength at high temperatures and ductility at ambient temperatures are crucial issues for these novel light-weight materials. By generation of two-phase lamellar TiAl + Ti3Al microstructures, these issues can be successfully solved. Because oxidation resistance at high temperatures is…
We will investigate the electrothermomechanical response of individual metallic nanowires as a function of microstructural interfaces from the growth processes. This will be accomplished using in situ SEM 4-point probe-based electrical resistivity measurements and 2-point probe-based impedance measurements, as a function of mechanical strain and…