Vurpillot, F.; Rousseau, L.; Hatzoglou, C.; Normand, A.; Gault, B.; Cerezo, A.: Beyond Atom Mapping in Atom Probe Tomography Using Field Evaporation Energy Loss Spectroscopy. Microscopy and Microanalysis 29 (Supplement_1), pp. 605 - 606 (2023)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
This project aims to develop a testing methodology for the nano-scale samples inside an SEM using a high-speed nanomechanical low-load sensor (nano-Newton load resolution) and high-speed dark-field differential phase contrast imaging-based scanning transmission electron microscopy (STEM) sensor.