Publications of Gerhard Dehm

Legros, M.; Kaouache, B.; Gergaud, P.; Thomas, O.; Dehm, G.; Balk, T. J.; Arzt, E.: Pipe-diffusion ripening of Si precipitates in Al-0.5% Cu-1%Si thin films. Philosophical Magazine 85 (30), pp. 3541 - 3552 (2005)

Cohen, S. S.; Goren-Muginstein, G. R.; Avraham, S.; Rashkova, B.; Dehm, G.; Bamberger, M. S.: Precipitation hardening in Mg–Zn–Sn alloys with minor additions of Ca and Si. Zeitschrift für Metallkunde 96 (9), pp. 1081 - 1087 (2005)

Girgsdies, F.; Ressler, T.; Wild, U.; Wübben, T.; Balk, T. J.; Dehm, G.; Zhou, L.; Günther, S.; Arzt, E.; Imbihl, R. et al.; Schlögl, R.: Strained thin copper films as model catalysts in the materials gap. Catalysis Letters 102 (1-2), pp. 91 - 97 (2005)

Kauffmann, F.; Ji, B.; Dehm, G.; Gao, H.; Arzt, E.: A quantitative study of the hardness in a superhard nanocrystalline titanium nitride/silicon nitride coating. Scripta Materialia 52 (12), pp. 1269 - 1274 (2005)

Bystrzanowski, S.; Bartels, A.; Clemens, H.; Gerling, R. W.; Schimansky, F. P.; Dehm, G.; Kestler, H.: Creep behaviour and related high temperature microstructural stability of Ti-46Al-9Nb sheet material. Intermetallics 13 (5), pp. 515 - 524 (2005)

Dehm, G.; Edongué, H.; Wagner, T. A.; Oh, S. H.; Arzt, E.: Obtaining different orientation relationships for Cu films grown on (0001) α-Al₂O₃ substrates by magnetron sputtering. Zeitschrift für Metallkunde 96 (3), pp. 249 - 254 (2005)

Kauffmann, F.; Dehm, G.; Schier, V.; Schattke, A.; Beck, T.; Lang, S.; Arzt, E.: Microstructural size effects on the hardness of nanocrystalline TiN/amorphous-SiN_x coatings prepared by magnetron sputtering. Thin Solid Films 473 (1), pp. 114 - 122 (2005)

Sauter, L. X.; Balk, T. J.; Dehm, G.; Nucci, J.; Arzt, E.: Hillock Formation and Thermal Stresses in Thin Au Films on Si Substrates. Materials Research Society Symposium Proceedings 875, O5.2, pp. 177 - 182 (2005)

Wellner, P.; Dehm, G.; Kraft, O.; Arzt, E.: Size effects in the plastic deformation of NiAl thin films. Zeitschrift für Metallkunde 95 (9), pp. 769 - 778 (2004)

Bischof, M.; Leitner, H.; Clemens, H.; Staron, P.; Dehm, G.; Voiticek, A.; Knabl, W.: Microstructure and mechanical properties of Si and YN doped powder metallurgical tantalum. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques 95 (7), pp. 573 - 578 (2004)

Volkert, C. A.; Busch, S.; Heiland, B.; Dehm, G.: Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling. Journal of Microscopy 214 (3), pp. 208 - 212 (2004)

Weller, M.; Clemens, H.; Haneczok, G.; Dehm, G.; Bartels, A.; Bystrzanowski, S.; Gerling, R. W.; Arzt, E.: Mechanical Spectroscopy of a High Nb Containing γ-TiAl Based Alloy with Near Gamma and Fully Lamellar Microstructure. Philosophical Magazine Letters 84 (6), pp. 383 - 393 (2004)

Wellner, P.; Kraft, O.; Dehm, G.; Andersons, J.; Arzt, E.: Channel cracking of β-NiAl thin films on Si substrates. Acta Materialia 52 (8), pp. 2325 - 2336 (2004)

Schmidt, T.; Balk, T. J.; Dehm, G.; Arzt, E.: Influence of tantalum and silver interlayers on thermal stress evolution in copper thin films on silicon substrates. Scripta Materialia 50 (6), pp. 733 - 737 (2004)

Inkson, B. J.; Dehm, G.; Wagner, T. A.: Thermal stability of Ti and Pt nanowires manufactured by Ga⁺ focused ion beam. Journal of Microscopy 214 (3), pp. 252 - 260 (2004)

Clemens, H.; Schubert, D. W.; Dehm, G.; Scheu, C.; Buttstaedt, J. L.: Characterization of biocompatible Ti(CNO) layers on polymeric substrates. Applied Surface Science 219 (3-4), pp. 329 - 337 (2003)

Schwaiger, R.; Dehm, G.; Kraft, O.: Cyclic deformation of polycrystalline Cu films. Philosophical Magazine 83 (6), pp. 693 - 710 (2003)

Dehm, G.; Bamberger, M. S.: Laser cladding of Co-based hardfacing on Cu substrate. Journal of Materials Science 37 (24), pp. 5345 - 5353 (2002)

Dehm, G.; Inkson, B. J.; Wagner, T. A.: Growth and microstructural stability of epitaxial Al films on (0001) α-Al₂O₃ substrates. Acta Materialia 50 (20), pp. 5021 - 5032 (2002)

Inkson, B. J.; Dehm, G.; Wagner, T. A.: In-situ TEM observation of dislocation motion in thermally strained Al nanowires. Acta Materialia 50 (20), pp. 5033 - 5047 (2002)