Journal Article
Richard, M.-I.; Cornelius, T. W.; Lauraux, F.; Molin, J.-B.; Kirchlechner, C.; Leake, S. J.; Carnis, J.; Schülli, T. U.; Thilly, L.; Thomas, O.: Variable-Wavelength Quick Scanning Nanofocused X-Ray Microscopy for In Situ Strain and Tilt Mapping. Small
16 (6), 1905990 (2020)