Publications of Stefan Zaefferer

Zaefferer, S.: Electron channelling contrast imaging (ECCI) – Recent advances and new applications. RMS-EBSD conference, Manchester, UK (2016)

Zaefferer, S.: Boundary characterisation using correlative ECCI and EBSD. ACMM pre-conference workshop, Geelong, Australia (2016)

Zaefferer, S.: Correlation of 5‐parameter GB character with GB properties. ACMM pre-conference workshop, Geelong, Australia (2016)

Archie, F. M. F.; Zaefferer, S.: Microstructural and micromechanical characterization of damage initiation in DP steels. Thermec 2016, Graz, Austria (2016)

Herbig, M.; Kuzmina, M.; Haase, C.; Molodov, D. A.; Marceau, R. K. W.; Gutiérrez-Urrutia, I.; Goto, S.; Zaefferer, S.; Choi, P.-P.; Raabe, D.: Measurement of grain boundary chemistry and crystallography by atom probe tomography and correlated electron microscopy. Thermec 2016, Graz, Austria (2016)

Zaefferer, S.: Exploring microstructure-property-relationships of crystalline materials by application of diffraction techniques (electron backscatter diffraction, EBSD, and electron channelling, ECCI) in the SEM. Australian conference on microscopy and microanalysis, Melbourne, Australia (2016)

Zaefferer, S.: Introduction to ECCI. EBSD Training Tutorial Workshop, Manchester, UK (2016)

Archie, F. M. F.; Zaefferer, S.: Strength and fracture toughness of AHSS: Influence of Grain and Interphase Boundaries. EUROMAT 2015, Warsaw, Poland (2015)

Mandal, S.; Pradeep, K. G.; Zaefferer, S.; Konijnenberg, P. J.; Raabe, D.: Linking crystallography with property: towards comprehensive characterization of grain boundaries. ICOTOM 17, Dresden, Germany (2015)

Zaefferer, S.: Measurement of electronic, chemical and mechanical properties of individual grain boundaries. ICOTOM 17; invited tutorial, Dresden, Germany (2015)

Zaefferer, S.; Ram, F.; Mandal, S.; Raabe, D.: Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by scanning electron microscopy-based diffraction techniques. ICOTOM 17; invited plenary, Dresden, Germany (2015)

Zaefferer, S.: SEM-based diffraction techniques for the study of deformation structures in metals. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, Hamburg, Germany (2015)

Zaefferer, S.; Archie, F. M. F.: Crystallographic and mechanical charactization of micro-bicrystal cantilevers. ICM 2015, Karlsruhe, Germany (2015)

Zaefferer, S.: State of the art of EBSD. EMAS 2015, Portoroz, Slovenia (2015)

Zaefferer, S.: Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by SEM-based diffraction techniques. Talk at Universität Bayreuth, Bayreuth, Germany (2015)

Li, Z.; Ram, F.; Zaefferer, S.; Raabe, D.; Reed, R. C.: Investigations of dislocation structures in a Ni-based single crystal superalloy using Electron Channeling Contrast Imaging (ECCI) and cross-correlation EBSD. RMS EBSD, Glasgow, Scotland, UK (2015)

Stechmann, G.; Zaefferer, S.: 3-dimensionnal Microstructural Characterization of CdTe-based Solar Cells. Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg, Stuttgart, Germany (2015)

Zaefferer, S.; Stechmann, G.: Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells. Workshop Morphologie und Mikrostruktur dünner Schichten, Dresden, Germany (2015)

Zaefferer, S.: Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by SEM-based diffraction techniques. Deutsche Nanoschicht, Bonn, Germany (2015)

Haghighat, S. M. H.; Li, Z.; Zaefferer, S.; Reed, R. C.; Raabe, D.: Mesoscale modeling of dislocation climb and primary creep process in single crystal Ni base superalloys. International Workshop on Dislocation Dynamics Simulations, Saclay, France (2014)