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Here you find links to the different techniques applied in our research group

Electron backscatter diffraction is an electron diffraction technique in scanning electron microscopy used to obtain information about crystallographic phase, crystal orientation and defect densities. [more]
ECCI is an imaging technique in scanning electron microscopy based on electron channelling applying a backscatter electron detector. It is used for direct observation of lattice defects, for example dislocations or stacking faults, close to the surface of bulk samples. [more]
Grain and phase boundaries are planar lattice defects where two crystal lattices of different orientation and/or different crystallographic structure meet. Grain boundaries strongly influence structural and functional properties of materials. Characterization can be done by various techniques for crystallograpic measurements. [more]
A (scanning) electron microscopy technique which measures crystal orientations on a regular grid by electron diffraction. The so-determined data are used to produce orientation or phase maps of the scanned area on the sample. [more]
EBSD-based orientation microscopy is by nature a 2-dimensional technique, revealing the microstructure existing close to the surface of the sample. By combining 2D-ORM with successive serial sectioning a 3D technique is developed. 3D microstructures are reconstructed from the individual sections by dedicated in-house software. [more]
XR-EBSD is a particular way to analyse EBSD patterns which allows measuring elastic distortions and residual stresses as well as very small rotations of a crystal lattice. [more]
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