Field ion emission microscopy techniques are a group of characterization tools employing humungous electric fields. Atom probe tomography (APT), field ion microscopy (FIM), field emission microscopy (FEM), analytical field ion microscopy (AFIM) are the few of these. The strong fields applied (10
6-10
10 V/m), induce a host of interesting phenomena at/near the specimen surface. Using density functional theory (DFT) and python based analysis algorithms, we have several projects to aid and inform these characterization routines, to advance and enable new horizons for field ion emission techniques.
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