Juntunen, P.; Raabe, D.; Karjalainen, P.; Kopio, T.; Bolle, G.: Optimizing continuous annealing of IF steels for improving their deep drawability. Metallurgical and Materials Transactions A 32, pp. 1989 - 1995 (2001)
Roters, F.; Raabe, D.; Gottstein, G.: Work hardening in heterogeneous alloys - A microstructural approach based on three internal state variables. Acta Materialia 48 (17), pp. 4181 - 4189 (2000)
Raabe, D.; Becker, R. C.: Coupling of a crystal plasticity finite element model with a probabilistic cellular automaton for simulating primary static recrystallization in aluminum. Modelling and Simulation in Materials Science and Engineering 8, pp. 445 - 462 (2000)
Raabe, D.; Miyake, K.; Takahara, H.: Processing, microstructure, and properties of ternary high-strength Cu–Cr–Ag in situ composites. Material Science and Engineering A 291, pp. 186 - 197 (2000)
Raabe, D.; Mattissen, D.: Experimental investigation and Ginzburg-Landau modeling of the microstructure dependence of superconductivity in Cu–Ag–Nb wires. Acta Materialia 47 (3), pp. 769 - 777 (1999)
Mattissen, D.; Raabe, D.; Heringhaus, F.: Experimental investigation and modeling of the influence of microstructure on the resistive conductivity of a Cu–Ag–Nb in situ composite. Acta Materialia 47, pp. 1627 - 1634 (1999)
Marx, V.; Raabe, D.; Engler, O.; Gottstein, G.: Simulation of the texture evolution during annealing of cold rolled BCC and FCC matals using a cellular automation approach. Textures and Microstructures 28, pp. 211 - 218 (1997)
Raabe, D.: Texture simulation for hot rolling of aluminium by use of a Taylor model considering grain interactions. Acta Metallurgica et Materialia 43 (3), pp. 1023 - 1028 (1995)
Roters, F.; Eisenlohr, P.; Bieler, T. R.; Raabe, D.: Crystal Plasticity Finite Element Methods in Materials Science and Engineering. Wiley-VCH, Weinheim (2010), 197 pp.
Janssens, K. G. F.; Raabe, D.; Kozeschnik, E.; Miodownik, M. A.; Nestler, B.: Computational Materials Engineering – An Introduction to Microstructure Evolution. Academic Press, Elsevier, USA (2007), 360 pp.
Shanthraj, P.; Diehl, M.; Eisenlohr, P.; Roters, F.; Raabe, D.: Spectral Solvers for Crystal Plasticity and Multi-physics Simulations. In: Handbook of Mechanics of Materials, pp. 1347 - 1372 (Eds. Hsueh, C.-H.; Schmauder, S.; Chen, C.-S.; Chawla, K. K.; Chawla, N. et al.). Springer, Singapore (2019)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Recent developments in experimental techniques and computer simulations provided the basis to achieve many of the breakthroughs in understanding materials down to the atomic scale. While extremely powerful, these techniques produce more and more complex data, forcing all departments to develop advanced data management and analysis tools as well as…
Integrated Computational Materials Engineering (ICME) is one of the emerging hot topics in Computational Materials Simulation during the last years. It aims at the integration of simulation tools at different length scales and along the processing chain to predict and optimize final component properties.
Data-rich experiments such as scanning transmission electron microscopy (STEM) provide large amounts of multi-dimensional raw data that encodes, via correlations or hierarchical patterns, much of the underlying materials physics. With modern instrumentation, data generation tends to be faster than human analysis, and the full information content is…
The project’s goal is to synergize experimental phase transformations dynamics, observed via scanning transmission electron microscopy, with phase-field models that will enable us to learn the continuum description of complex material systems directly from experiment.
In order to prepare raw data from scanning transmission electron microscopy for analysis, pattern detection algorithms are developed that allow to identify automatically higher-order feature such as crystalline grains, lattice defects, etc. from atomically resolved measurements.