Zaefferer, S.: An overview on techniques for high spatial resolution measurements of plastic and elastic strain by EBSD and related techniques. RexGG pre-conference workshop, Wollongong, Australia (2013)
Zaefferer, S.; Konijnenberg, P. J.: Advanced analysis of 3D EBSD data obtained from FIB-EBSD tomography. RexGG pre-conference workshop, Wollongong, Australia (2013)
Zaefferer, S.: An overview on techniques for high spatial resolution measurements of plastic and elastic strain by EBSD and related techniques. MicroCar 2013, Leipzig, Germany (2013)
Schemmann, L.; Zaefferer, S.: First experiences using a low-energy WDX spectrometer (LEXS) on a FEG-SEM for carbon determination on a martensitic steel. EMAS 2013, Porto, Portugal (2013)
Schemmann, L.; Zaefferer, S.; Raabe, D.: Influence of the inheritance of chemical elements on the transformation behaviour during intercritical annealing of DP steel strips. Euromat 2013, Sevilla, Spain (2013)
Zaefferer, S.: Techniques and application of 3D orientation microscopy based on EBSD tomography. GN-MEBA (groupement nationale de microscopie electronique a balayage) 2013, Paris, France (2013)
Zaefferer, S.: Combined Application of EBSD and ECCI for Crystal Defect Observation in Bulk Samples. GN-MEBA (groupement nationale de microscopie electronique a balayage) 2013, Paris, France (2013)
Zaefferer, S.; Elhami, N. N.: Theory and application of electron channelling contrast imaging (ECCI) of defects in metals. RMS EBSD 2013, Oxford, UK (2013)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
This project aims to develop a testing methodology for the nano-scale samples inside an SEM using a high-speed nanomechanical low-load sensor (nano-Newton load resolution) and high-speed dark-field differential phase contrast imaging-based scanning transmission electron microscopy (STEM) sensor.
We will investigate the electrothermomechanical response of individual metallic nanowires as a function of microstructural interfaces from the growth processes. This will be accomplished using in situ SEM 4-point probe-based electrical resistivity measurements and 2-point probe-based impedance measurements, as a function of mechanical strain and…