Publications of Jiwon Jeong

Jeong, J.; Xie, Z.; Alfreider, M.; Korte-Kerzel, S.; Kiener, D.; Guenole, J.; Oh, S. H.: Nanoscale mechanisms limiting non-basal plasticity in magnesium. Acta Materialia 296, 121261 (2025)

Cautaerts, N.; Crout, P.; Ånes, H. W.; Prestat, E.; Jeong, J.; Dehm, G.; Liebscher, C.: Free, flexible and fast: Orientation mapping using the multi-core and GPU-accelerated template matching capabilities in the Python-based open source 4D-STEM analysis toolbox Pyxem. Ultramicroscopy 237, 113517 (2022)

Tsianikas, S. J.; Chen, Y.; Jeong, J.; Zhang, S.; Xie, Z.: Forging strength–ductility unity in a high entropy steel. Journal of Materials Science & Technology 113, pp. 158 - 165 (2022)

Kim, S.-H.; Yoo, S.-H.; Chakraborty, P.; Jeong, J.; Lim, J.; El-Zoka, A.; Zhou, X.; Stephenson, L.; Hickel, T.; Neugebauer, J. et al.; Scheu, C.; Todorova, M.; Gault, B.: Understanding Alkali Contamination in Colloidal Nanomaterials to Unlock Grain Boundary Impurity Engineering. Journal of the American Chemical Society 144 (2), pp. 987 - 994 (2022)

Kim, S.-H.; Yoo, S.-H.; Shin, S.; El-Zoka, A.; Kasian, O.; Lim, J.; Jeong, J.; Scheu, C.; Neugebauer, J.; Lee, H. et al.; Todorova, M.; Gault, B.: Controlled Doping of Electrocatalysts through Engineering Impurities. Advanced Materials, 2203030 (2022)

Jeong, J.; Cautaerts, N.; Dehm, G.; Liebscher, C.: Automated Crystal Orientation Mapping by Precession Electron Diffraction-Assisted Four-Dimensional Scanning Transmission Electron Microscopy Using a Scintillator-Based CMOS Detector. Microscopy and Microanalysis 27 (5), pp. 1102 - 1112 (2021)

Cautaerts, N.; Rauch, E. F.; Jeong, J.; Dehm, G.; Liebscher, C.: Investigation of the orientation relationship between nano-sized G-phase precipitates and austenite with scanning nano-beam electron diffraction using a pixelated detector. Scripta Materialia 201, 113930 (2021)

Jeong, J.; Jang, W.-S.; Kim, K. H.; Kostka, A.; Gu, G.; Kim, Young, Y.-M.; Oh, S. H.: Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction. Microscopy and Microanalysis 27 (2), pp. 237 - 249 (2021)

Kiener, D.; Jeong, J.; Alfreider, M.; Konetschnik, R.; Oh, S. H.: Prospects of using small scale testing to examine different deformation mechanisms in nanoscale single crystals - A case study in Mg. Crystals 11 (1), 61 (2021)

Tsianikas, S.; Chen, Y.; Jeong, J.; Zhang, S.; Xie, Z.: Self-toughened high entropy alloy with a body-centred cubic structure. Nanoscale 13, pp. 3602 - 3612 (2021)

Jeong, J.: Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Seminar, Korea Institute of Industrial Technology (KITECH), Seoul, South Korea (2019)

Jeong, J.: Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Seminar, Korea Institute of Materials Science (KIMS), Seoul, South Korea (2019)

Jeong, J.: Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Seminar, Korea Institute of Science and Technology (KIST), Seoul, South Korea (2019)

Jeong, J.; Dehm, G.; Liebscher, C.: Advances in automatic TEM based orientation mapping with precession electron diffraction. KSM Annual Fall Conference 2019, Gyeongju, South Korea (2019)

Jeong, J.; Kim, J.; Kiener, D.; Oh, S. H.: In-situ TEM observation of twin-dominated deformation of Mg single crystals. KSM Annual Fall Conference 2019, Gyeongju, South Korea (2019)

Arigela, V. G.; Oellers, T.; Luo, W.; Jeong, J.; Stein, F.; Ludwig, A.; Kirchlechner, C.; Dehm, G.: Development and applications of a high temperature nano-/micro mechanics device with a novel temperature measurement approach. Euromat 2019, Stockholm, Sweden (2019)

Jeong, J.; Dehm, G.; Liebscher, C.: Advances in automatic TEM based orientation mapping with precession electron diffraction. Joint Max-Planck-Institut für Eisenforschung MPIE) / Ernst Ruska-Centre (ER-C) Workshop, Düsseldorf, Germany (2019)

Jeong, J.; Dehm, G.; Liebscher, C.: Advances in automatic TEM based orientation mapping with precession electron diffraction. International Workshop on Advanced In Situ Microscopies of Functional Nanomaterials and Devices (IAMnano 2019), Düsseldorf, Germany (2019)