Publications of Stefan Zaefferer

Zaefferer, S.: Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by SEM-based diffraction techniques. Talk at Universität Bayreuth, Bayreuth, Germany (2015)

Li, Z.; Ram, F.; Zaefferer, S.; Raabe, D.; Reed, R. C.: Investigations of dislocation structures in a Ni-based single crystal superalloy using Electron Channeling Contrast Imaging (ECCI) and cross-correlation EBSD. RMS EBSD, Glasgow, Scotland, UK (2015)

Stechmann, G.; Zaefferer, S.: 3-dimensionnal Microstructural Characterization of CdTe-based Solar Cells. Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg, Stuttgart, Germany (2015)

Zaefferer, S.; Stechmann, G.: Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells. Workshop Morphologie und Mikrostruktur dünner Schichten, Dresden, Germany (2015)

Zaefferer, S.: Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by SEM-based diffraction techniques. Deutsche Nanoschicht, Bonn, Germany (2015)

Haghighat, S. M. H.; Li, Z.; Zaefferer, S.; Reed, R. C.; Raabe, D.: Mesoscale modeling of dislocation climb and primary creep process in single crystal Ni base superalloys. International Workshop on Dislocation Dynamics Simulations, Saclay, France (2014)

Zaefferer, S.: Quantitative Analyse von Kristalldefekten in Werkstoffen mittels Beugungsmethoden im Rasterelektronenmikroskop. Workshop in honour of Professor Füting, Hochschule Köthen, Köthen, Germany (2014)

Herbig, M.; Raabe, D.; Li, Y.; Choi, P.-P.; Zaefferer, S.; Goto, S.: Joint crystallographic and chemical characterization at the nanometer scale by correlative TEM and atom probe tomography. Workshop: White-etching layers in ball and roller bearings, Informatik-Zentrum Hörn, Aachen, Germany (2014)

Zaefferer, S.: Texture and microstructures of thin film solar cells. Autumn School on Microstructural Characterization and Modelling of Thin-Film Solar Cells, Potsdam, Germany (2014)

Haghighat, S. M. H.; Li, Z.; Zaefferer, S.; Reed, R. C.; Raabe, D.: Characterization and modeling of the propagation of creep dislocations from the interdendritic boundaries in single crystal Ni base superalloys. International Workshop on Modelling and Simulation of Superalloys, Bochum, Germany (2014)

Konijnenberg, P. J.; Zaefferer, S.; Raabe, D.: GND Analysis of a Copper Micro Cantilever Beam. MSE 2014, Darmstadt, Germany (2014)

Zaefferer, S.: Characterization tools for studying recrystallization mechanisms. CNRS summer school on recrystallization, Frejus, France (2014)

Zaefferer, S.; Mandal, S.; Bozzolo, N.: Correlative Measurement of the 5-parameter Grain Boundary Character and its Physical and Chemical Properties. MSE 2014, Darmstadt, Germany (2014)

Zhang, J.; Zaefferer, S.; Liu, B.; Raabe, D.: Observation of Dislocation Patterns around Nanoindents using cECCI. Materials Science and Engineering (MSE2014), Darmstadt, Germany (2014)

Zaefferer, S.: Application of EBSD and ECCI for the Investigation of Microstructures of Engineering Materials. Constellium, Grenoble, France (2014)

Schemmann, L.; Romano Triguero, P.; Zaefferer, S.: Eine Untersuchung zur ferritisch-bainitischen Umwandlung in einem Dualphasenstahl unter Verwendung von EBSD-basierten Misorientierungsmessungen. Arbeitskreistreffen: Mikrostrukturcharakterisierung im REM, Düsseldorf, Germany (2014)

Zaefferer, S.: Quantitative analysis of crystal defects by means of EBSD and related methods. Arbeitskreistreffen: Mikrostrukturcharakterisierung im REM, Düsseldorf, Germany (2014)

Zaefferer, S.: Application of EBSD and ECCI for the Investigation of Microstructures of Engineering Materials. MSA EBSD 2014, Pittsburgh, PA, USA (2014)

Zaefferer, S.: Application of diffraction techniques in the scanning electron microscope for the investigation of microstructures of engineering materials. Deutsche Versuchsanstalt für Luft und Raumfahrt (DLR), Köln, Germany (2014)

Stechmann, G.; Zaefferer, S.; Konijnenberg, P. J.; Raabe, D.; Gretener, C.; Kranz, L.; Perrenoud, J.; Bücheler, S.; Tiwari, A. N.: 3-Dimensional Microstructural and Crystallographic Characterization of CdTe Absorber Layers from CdTe/CdS Solar Cells Grown in Substrate Configuration. E-MRS, European Materials Research Society Conference 2014 , Lille, France (2014)