Friák, M.; Tytko, D.; Holec, D.; Choi, P.-P.; Eisenlohr, P.; Raabe, D.; Neugebauer, J.: Synergy of atom-probe structural data and quantum-mechanical calculations in a theory-guided design of extreme-stiffness superlattices containing metastable phases. New Journal of Physics 17 (9), 093004 (2015)
Tytko, D.; Choi, P.-P.; Raabe, D.: Thermal dissolution mechanisms of AlN/CrN hard coating superlattices studied by atom probe tomography and transmission electron microscopy. Acta Materialia 85, pp. 32 - 41 (2015)
Sandim, M. J. R.; Tytko, D.; Kostka, A.; Choi, P.; Awaji, S.; Watanabe, K.; Raabe, D.: Grain boundary segregation in a bronze-route Nb3Sn superconducting wire studied by atom probe tomography. Superconductor Science and Technology 26, pp. 055008-1 - 055008-7 (2013)
Tytko, D.; Choi, P.-P.; Klöwer, J.; Inden, G.; Raabe, D.: Microstructural evolution of a Ni-based superalloy (617B) at 700 °C studied by electron microscopy and atom probe tomography. Acta Materialia 60 (4), pp. 1731 - 1740 (2012)
Jägle, E. A.; Tytko, D.; Choi, P.-P.; Raabe, D.: Deformation-induced intermixing in a model multilayer system. Atom Probe Tomography & Microscopy 2014, Stuttgart, Germany (2014)
New machine learning framework makes metal recycling more sustainable without compromising on mechanical properties. Results now published in journal Science Advances.
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
The project’s goal is to synergize experimental phase transformations dynamics, observed via scanning transmission electron microscopy, with phase-field models that will enable us to learn the continuum description of complex material systems directly from experiment.
In order to prepare raw data from scanning transmission electron microscopy for analysis, pattern detection algorithms are developed that allow to identify automatically higher-order feature such as crystalline grains, lattice defects, etc. from atomically resolved measurements.