Cautaerts, N.; Rauch, E. F.; Jeong, J.; Dehm, G.; Liebscher, C.: Investigation of the orientation relationship between nano-sized G-phase precipitates and austenite with scanning nano-beam electron diffraction using a pixelated detector. Scripta Materialia 201, 113930 (2021)
Jeong, J.; Jang, W.-S.; Kim, K. H.; Kostka, A.; Gu, G.; Kim, Young, Y.-M.; Oh, S. H.: Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction. Microscopy and Microanalysis 27 (2), pp. 237 - 249 (2021)
Kiener, D.; Jeong, J.; Alfreider, M.; Konetschnik, R.; Oh, S. H.: Prospects of using small scale testing to examine different deformation mechanisms in nanoscale single crystals - A case study in Mg. Crystals 11 (1), 61 (2021)
Jeong, J.: Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Seminar, Korea Institute of Industrial Technology (KITECH), Seoul, South Korea (2019)
Jeong, J.: Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Seminar, Korea Institute of Materials Science (KIMS), Seoul, South Korea (2019)
Jeong, J.: Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Seminar, Korea Institute of Science and Technology (KIST), Seoul, South Korea (2019)
Jeong, J.; Dehm, G.; Liebscher, C.: Advances in automatic TEM based orientation mapping with precession electron diffraction. KSM Annual Fall Conference 2019, Gyeongju, South Korea (2019)
Jeong, J.; Kim, J.; Kiener, D.; Oh, S. H.: In-situ TEM observation of twin-dominated deformation of Mg single crystals. KSM Annual Fall Conference 2019, Gyeongju, South Korea (2019)
Jeong, J.; Dehm, G.; Liebscher, C.: Advances in automatic TEM based orientation mapping with precession electron diffraction. Joint Max-Planck-Institut für Eisenforschung MPIE) / Ernst Ruska-Centre (ER-C) Workshop, Düsseldorf, Germany (2019)
Jeong, J.; Dehm, G.; Liebscher, C.: Advances in automatic TEM based orientation mapping with precession electron diffraction. International Workshop on Advanced In Situ Microscopies
of Functional Nanomaterials and Devices (IAMnano 2019), Düsseldorf, Germany (2019)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Atom probe tomography (APT) is one of the MPIE’s key experiments for understanding the interplay of chemical composition in very complex microstructures down to the level of individual atoms. In APT, a needle-shaped specimen (tip diameter ≈100nm) is prepared from the material of interest and subjected to a high voltage. Additional voltage or laser…
Ever since the discovery of electricity, chemical reactions occurring at the interface between a solid electrode and an aqueous solution have aroused great scientific interest, not least by the opportunity to influence and control the reactions by applying a voltage across the interface. Our current textbook knowledge is mostly based on mesoscopic…
Recent developments in experimental techniques and computer simulations provided the basis to achieve many of the breakthroughs in understanding materials down to the atomic scale. While extremely powerful, these techniques produce more and more complex data, forcing all departments to develop advanced data management and analysis tools as well as…
Data-rich experiments such as scanning transmission electron microscopy (STEM) provide large amounts of multi-dimensional raw data that encodes, via correlations or hierarchical patterns, much of the underlying materials physics. With modern instrumentation, data generation tends to be faster than human analysis, and the full information content is…
The project’s goal is to synergize experimental phase transformations dynamics, observed via scanning transmission electron microscopy, with phase-field models that will enable us to learn the continuum description of complex material systems directly from experiment.
In order to prepare raw data from scanning transmission electron microscopy for analysis, pattern detection algorithms are developed that allow to identify automatically higher-order feature such as crystalline grains, lattice defects, etc. from atomically resolved measurements.