Talk
Cojocaru-Mirédin, O.; Choi, P.; Wuerz, R.; Abou-Ras, D.; Liu, T.; Schmidt, S. S.; Caballero, R.; Raabe, D.: Characterization of grain boundaries in Cu(In,Ga)Se
2 thin-film using APT. 1st Workshop on Characterization of Grain Boundaries in CIGS-thin films, Berlin, Germany (2011)