Deformation mechanisms and mechanical properties of single crystal Si under nanotribological loading

Publications of Davis L. Olmsted

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Journal Article (1)

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Journal Article
Ratanaphan, S.; Raabe, D.; Sarochawikasit, R.; Olmsted, D. L.; Rohrer, G. S.; Tu, K.: Grain boundary character distribution in electroplated nanotwinned copper. Journal of Materials Science 52 (7), pp. 4070 - 4085 (2017)
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