Journal Article
Patterer, L.; Mayer, E.; Mráz, S.; Pöllmann, P. J.; Hans, M.; Primetzhofer, D.; Souza Filho, I. R.; Springer, H.; Schneider, J.: Effect of Si on the hydrogen-based direct reduction of Fe
2O
3 studied by XPS of sputter-deposited thin-film model systems. Scripta Materialia
233, 115515 (2023)