Publications of Joohyun Lim

Kim, S.-H.; Yoo, S.-H.; Chakraborty, P.; Jeong, J.; Lim, J.; El-Zoka, A.; Zhou, X.; Stephenson, L.; Hickel, T.; Neugebauer, J. et al.; Scheu, C.; Todorova, M.; Gault, B.: Understanding Alkali Contamination in Colloidal Nanomaterials to Unlock Grain Boundary Impurity Engineering. Journal of the American Chemical Society 144 (2), pp. 987 - 994 (2022)

Kim, S.-H.; Yoo, S.-H.; Shin, S.; El-Zoka, A.; Kasian, O.; Lim, J.; Jeong, J.; Scheu, C.; Neugebauer, J.; Lee, H. et al.; Todorova, M.; Gault, B.: Controlled Doping of Electrocatalysts through Engineering Impurities. Advanced Materials, 2203030 (2022)

Zhang, S.; Ahmet, I.; Kim, S.-H.; Kasian, O.; Mingers, A. M.; Schnell, P.; Kölbach, M.; Lim, J.; Fischer, A.; Mayrhofer, K. J. J. et al.; Cherevko, S.; Gault, B.; van de Krol, R.; Scheu, C.: Different Photostability of BiVO₄ in Near-pH-Neutral Electrolytes. ACS Applied Energy Materials 3 (10), pp. 9523 - 9527 (2020)

Lim, J.; Kasiri, G.; Sahu, R.; Schweinar, K.; Hengge, K. A.; Raabe, D.; La Mantia, F.; Scheu, C.: Irreversible Structural Changes of Copper Hexacyanoferrate used as Cathode in Zn‐Ion Batteries. Chemistry – A European Journal 26 (22), pp. 4917 - 4922 (2020)

Lim, J.; Kasiri, G.; Sahu, R.; Schweinar, K.; Hengge, K.; Raabe, D.; La Mantia, F.; Scheu, C.: Frontispiece: Irreversible Structural Changes of Copper Hexacyanoferrate Used as a Cathode in Zn-Ion Batteries. Chemistry - A European Journal 26 (22), pp. 4917 - 4922 (2020)

Lim, J.; Kim, S.-H.; Aymerich Armengol, R.; Kasian, O.; Choi, P.-P.; Stephenson, L.; Gault, B.; Scheu, C.: Atomic‐Scale Mapping of Impurities in Partially Reduced Hollow TiO₂ Nanowires. Angewandte Chemie International Edition 59 (14), pp. 5651 - 5655 (2020)

Joohyun Lim; Se-Ho Kim; Raquel Aymerich Armengol; Olga Kasian; Pyuck-Pa Choi; Leigh Stephenson; Baptiste Gault; Christina Scheu: Atomic-Scale Mapping of Impurities in Partially Reduced Hollow TiO₂ Nanowires. Angewandte Chemie (deutsche Ausgabe) 132 (14), pp. 5700 - 5704 (2020)

Kim, S.-H.; Lim, J.; Sahu, R.; Kasian, O.; Stephenson, L.; Scheu, C.; Gault, B.: Direct Imaging of Dopant and Impurity Distributions in 2D MoS₂. Advanced Materials 32 (8), 1907235 (2020)