Vogel, D.; Swaminathan, S.; Rohwerder, M.; Renner, F. U.: Possibilities for high-temperature corrosion at MPIE. International Symposium on High-temperature Oxidation and Corrosion, Zushi, Japan (2010)
Vogel, A.; Swaminathan, S.; Vogel, D.; Rohwerder, M.: Novel Setup for Metal/Gas Reactions at High Temperature. 6th International Conference on Diffusion in Solids and Liquids: Mass Transfer, Heat Transfer and Microstructure and Properties, Paris, France (2010)
Vogel, D.; Renner, F. U.; Rohwerder, M.; Stratmann, M.: Novel setups pushing the limits of high-temperature reaction studies. Gordon Research Conference on High Temperature Corrosion, New London, NH, USA (2010)
Auinger, M.; Rohwerder, M.: Thermodynamic Simulations of Gas-Nitriding in Iron-Chromium and Iron-Silicon Alloys. European Conference “Nitriding and Nitrocarburising”, Aachen, Germany (2010)
Salgin, B.; Rohwerder, M.: Scanning Kelvin Probe (SKP) as a tool for monitoring ion mobility on insulators. M2i Conference 2009, Noordwijkerhout, The Netherlands (2009)
Hamou, R. F.; Erbe, A.; Rohwerder, M.: Screening effects in probing the double layer by scanning electrochemical potential microscopy. Comsol European Conference October 2009, Milan, Italy (2009)
Auinger, M.; Rohwerder, M.: Numerical Simulation of High Temperature Corrosion Processes in Mn, Cr, Si, Al–Steels. Thermodynamics 2009, Imperial College London, U. K. (2009)
Auinger, M.; Rohwerder, M.: Grain Boundary Oxidation at High Temperatures in Alloyed Steel Samples. Electrochem09 and 50th Corrosion Science Symposium, Manchester, UK (2009)
Senöz, C.; Rohwerder, M.: Application of Atomic Force Microscopy in its Kelvin Probe Mode (SKPFM) over Filiform Corrosion of Aluminum Alloys. Workshop on Scanning Probe Microscopies and Organic Materials XVII, Bremen, Germany (2009)
Senöz, C.; Maljusch, A.; Rohwerder, M.; Schuhmann, W.: Microstructural and Surface Potential Study of Al–4 wt% Cu–Mg (DURAL) Alloy. ICAA 11, 11th International Conference on Aluminium Alloys, Aachen, Germany (2008)
Ankah, G. N.; Renner, F. U.; Rohwerder, M.: Fundamental Investigations of the Corrosion of Binary Alloys. 59th Annual Meeting of the International Society of Electrochemistry, Sevilla, Spain (2008)
Borissov, D.; Renner, F. U.; Rohwerder, M.: Zn–Mg–Al alloy electrodeposition from ionic liquids. 59th Annual Meeting of the International Society of Electrochemistry, Sevilla, Spain (2008)
Rohwerder, M.: Role of Locallized Protection for the Performance of Conducting Polymer Based Composite Coatings. The 7th International Symposium on Electrochemical Micro and Nanosystem Technologies (EMNT 08), Kibbutz Ein Gedi, Israel (2008)
Hamou, R. F.; Biedermann, P. U.; Rohwerder, M.; Blumenau, A. T.: FEM Simulation of the Scanning Electrochemical Potential Microscopy (SECPM). 2nd IMPRS-SurMat Workshop in Surface and Interface Engineering in Advanced Materials, Ruhr-Universität Bochum, Bochum, Germany (2008)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Integrated Computational Materials Engineering (ICME) is one of the emerging hot topics in Computational Materials Simulation during the last years. It aims at the integration of simulation tools at different length scales and along the processing chain to predict and optimize final component properties.
Data-rich experiments such as scanning transmission electron microscopy (STEM) provide large amounts of multi-dimensional raw data that encodes, via correlations or hierarchical patterns, much of the underlying materials physics. With modern instrumentation, data generation tends to be faster than human analysis, and the full information content is…
The project’s goal is to synergize experimental phase transformations dynamics, observed via scanning transmission electron microscopy, with phase-field models that will enable us to learn the continuum description of complex material systems directly from experiment.
In order to prepare raw data from scanning transmission electron microscopy for analysis, pattern detection algorithms are developed that allow to identify automatically higher-order feature such as crystalline grains, lattice defects, etc. from atomically resolved measurements.