Klemm, S. O.; Topalov, A. A.; Laska, C. A.; Mayrhofer, K. J. J.: Coupling of a high throughput microelectrochemical cell with online multielemental trace analysis by ICP-MS. Electrochemistry Communications 13 (12), pp. 1533 - 1535 (2011)
Laska, C. A.; Rossrucker, L.; Klemm, S. O.; Pust, S. E.; Hüpkes, J.; Mayrhofer, K. J. J.: Die Kopplung von Elektrochemie mit zeitaufgelöster Elementanalytik am Beispiel der chemischen und elektrochemischen Oberflächentexturierung von ZnO-Dünnschichten. In: Tagungsband zur Jahrestagung der Gesellschaft für Korrosionsschutz e.V. 2013, pp. 118 - 128. Jahrestagung der Gesellschaft für Korrosionsschutz e.V. , Frankfurt am Main, Germany, November 12, 2013 - November 13, 2013. (2013)
Laska, C. A.: Development of a Scanning Flow Cell system with Dynamic Electrolyte Change for Fully Automated Parameter Screening. Dissertation, Ruhr-Universität Bochum, Bochum, Germany (2015)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
This project targets to exploit or develop new methodologies to not only visualize the 3D morphology but also measure chemical distribution of as-synthesized nanostructures using atom probe tomography.
Project C3 of the SFB/TR103 investigates high-temperature dislocation-dislocation and dislocation-precipitate interactions in the gamma/gamma-prime microstructure of Ni-base superalloys.
Statistical significance in materials science is a challenge that has been trying to overcome by miniaturization. However, this process is still limited to 4-5 tests per parameter variance, i.e. Size, orientation, grain size, composition, etc. as the process of fabricating pillars and testing has to be done one by one. With this project, we aim to…
In this project, we investigate the segregation behavior and complexions in the CoCrFeMnNi high-entropy alloys (HEAs). The structure and chemistry in the HEAs at varying conditions are being revealed systematically by combining multiple advanced techniques such as electron backscatter diffraction (EBSD) and atom probe tomography (APT).