Tasan, C. C.; Diehl, M.; Yan, D.; Raabe, D.: Coupled high-resolution experiments and crystal plasticity simulations to analyze stress and strain partitioning in multi-phase alloys. TMS2015, Orlando, FL, USA (2015)
Tasan, C. C.; Yan, D.; Raabe, D.: A novel, high-resolution approach for concurrent mapping of micro-strain and micro-structure evolution up to damage nucleation. TMS 2015, Orlando, FL, USA (2015)
Roters, F.; Diehl, M.; Shanthraj, P.; Zambaldi, C.; Tasan, C. C.; Yan, D.; Raabe, D.: Simulation analysis of stress and strain partitioning in dual phase steel based on real microstructures. MMM2014, 7th International Conference on Multiscale
Materials Modeling
, Berkeley, CA, USA (2014)
Tasan, C. C.; Diehl, M.; Yan, D.; Zambaldi, C.; Shanthraj, P.; Roters, F.; Raabe, D.: Integrated experimental and simulation analysis of stress and strain partitioning in dual phase steel. IUTAM Symposium on Connecting Multiscale Mechanics to Complex Material Design, Evanston, IL, USA (2014)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
In this project, we study the atomistic structure and phase transformations of tilt grain boundaries in Cu by using aberration-corrected scanning transmission electron microscope to build a relation to the transport properties of the grain boundaries via macroscopic tracer diffusion experiments. In the meantime, we address the impact of the grain…
Because of their excellent corrosion resistance, high wear resistance and comparable low density, Fe–Al-based alloys are an interesting alternative for replacing stainless steels and possibly even Ni-base superalloys. Recent progress in increasing strength at high temperatures has evoked interest by industries to evaluate possibilities to employ…
The goal of this project is to optimize the orientation mapping technique using four-dimensional scanning transmission electron microscopy (4D STEM) in conjunction with precession electron diffraction (PED). The development of complementary metal oxide semiconductor (CMOS)-based cameras has revolutionized the capabilities in data acquisition due to…