Zhang, S.; Scheu, C.: Evaluation of EELS spectrum imaging data by spectral components and factors from multivariate analysis. Microscopy 67 (suppl_1), pp. i133 - i141 (2018)
Hieke, S. W.; Dehm, G.; Scheu, C.: Annealing induced void formation in epitaxial Al thin films on sapphire (α-Al2O3). Acta Materialia 140, pp. 355 - 365 (2017)
International researcher team presents a novel microstructure design strategy for lean medium-manganese steels with optimized properties in the journal Science
This project aims to develop a testing methodology for the nano-scale samples inside an SEM using a high-speed nanomechanical low-load sensor (nano-Newton load resolution) and high-speed dark-field differential phase contrast imaging-based scanning transmission electron microscopy (STEM) sensor.