Publications of Gerhard Dehm

Dehm, G.: Probing deformation mechanisms of Cu structures relevant for electronic applications. Electronic Materials and Applications, Orlando, FL, USA (2015)

Dehm, G.: Phase stability in nanostructured metallic materials with exceptional strength. 2015 MRS Fall Meeting, Symposium VV: In situ study of synthesis and transformation of materials, Boston, MA, USA (2015)

Harzer, T. P.; Djaziri, S.; Raghavan, R.; Dehm, G.: Nanostructure and mechanical behavior of metastable Cu–Cr thin films grown by molecular beam epitaxy. 61. Metallkunde-Kolloquium - Werkstoffforschung für Wirtschaft und Gesellschaft, Lech am Arlberg, Austria (2015)

Jaya, B. N.; Kirchlechner, C.; Dehm, G.: Probing deformation and fracture of materials with high spatial resolution. EDSA 2015 – International Workshop on Stress Assisted Environmental Damage in Structural Materials, Chennai, India (2015)

Jaya, B. N.; Kirchlechner, C.; Dehm, G.: Are micro-fracture tests reliable? 2015 MRS Fall Meeting and Exhibit - Symposium T: Strength and Failure at the Micro and Nano-scale-From fundamentals to Applications , Boston, MA, USA (2015)

Kirchlechner, C.; Motz, C.; Imrich, P. J.; Malyar, N.; Micha, J.-S.; Ulrich, O.; Dehm, G.: In situ micromechanics: An overview on µLaue based experiments to study GND accumulation in various loading geometries. International Symposium on Plasticity, Keynote lecture, Montego Bay, Jamaica (2015)

Dehm, G.: Small Scale Mechanical Testing: More than just a fashionably tool?! Kolloquium für Mechanik, KIT, Karlsruhe, Germany (2014)

Dehm, G.: Differences in deformation behavior of Cu structures containing individual grain boundaries. Symposium RR: Scaling Effects in Plasticity - Synergy between Simulations and Experiments, Fall MRS, Boston, MA, USA (2014)

Hodnik, N.; Baldizzone, C.; Jeyabharathi, C.; Dehm, G.; Mayrhofer, K. J. J.: Bridging the gap between electrochemistry and microscopy: electrochemical IL-TEM and in-situ electrochemical TEM study. 2nd Conference on in In-situ and Correlative Electron Microscopy, Saarbrücken, Germany (2014)

Marx, V. M.; Cordill, M. J.; Kirchlechner, C.; Dehm, G.: In-situ stress measurements in thin films using synchrotron diffraction. Summer School: Theory and Practice of Modern Powder Diffraction, Tagungshaus Schönenberg, Ellwangen, Ellwangen, Germany (2014)

Brinckmann, S.; Fink, C.; Dehm, G.: Nanotribology: Wear Mechanisms in Austenite. Materials Science and Engineering-MSE 2014, Darmstadt, Germany (2014)

Kirchlechner, C.; Micha, J.-S.; Ulrich, O.; Dehm, G.: In situ micromechanics: An overview on synchrotron based µLaue experiments. XTOP 2014, Villard de Lans, France (2014)

Raghavan, R.; Wheeler, J. M.; Harzer, T. P.; Chawla, V.; Djaziri, S.; Thomas, K.; Philippi, B.; Wehrs, J.; Michler, J.; Dehm, G.: Mechanical behavior of nanolayered thin films: Interface control. 3rd General Meeting of the GDRi CNRS "Mechanics of Nano-objects", Empa, Thun, Switzerland (2014)

Jaya, B. N.; Kirchlechner, C.; Dehm, G.: Design and development of fracture property measurement techniques at the small scale. ICAMS (RUB), Bochum, Germany (2014)

Marx, V. M.; Kirchlechner, C.; Berger, J.; Cordill, M. J.; Dehm, G.: In-situ stress measurements in Cu films using synchrotron radiation. "Mechanical Issues for Flexible Electronics" Flex Workshop, Erich Schmid Institut, Leoben, Leoben, Austria (2014)

Dehm, G.: From idealized bi-crystals towards applied polycrystals: Plastic deformation in small dimensions. Schöntal Symposium - Dislocation-based Plasticity, Kloster Schöntal, Germany (2014)

Dehm, G.; Imrich, P. J.; Wimmer, A. C.; Kirchlechner, C.: From idealized bi-crystals towards applied polycrystals: Plastic deformation in small dimensions. TMS2014, 143rd Annual Meeting & Exhibition, San Diego, CA, USA (2014)

Jaya, B. N.; Kirchlechner, C.; Dehm, G.: Clamped beam geometry for fracture toughness testing of (Pt,Ni)Al bond coats at the micron-scale. AK- Rasterkraftmikroskopie und Nanomechanische Methoden, Düsseldorf, Germany (2014)

Marx, V. M.; Kirchlechner, C.; Cordill, M. J.; Dehm, G.: Effects of the film thickness on the deformation behavior of thin Cu films on polyimide. Arbeitskreistreffen Rasterkraftmikroskopie und nanomechanische Methoden, Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf, Germany (2014)

Marx, V. M.; Kirchlechner, C.; Cordill, M. J.; Dehm, G.: Film thickness effects on the deformation behavior of Cu/Cr thin films on polyimide. TMS 2014: 143rd Annual Meeting & Exhibition, San Diego, CA, USA (2014)