Poster
Mattlat, D. A.; Jung, C.; Ying, P.; Li, J.; He, S.; Bahrami, A.; Zhang, S.; Scheu, C.: New method of FIB TEM sample preparation for in situ heating and biasing MEMS chip used for investigation on Zn
4Sb
3 thermoelectric material. Microscopy Conference (MC) 2025, Karlsruhe, Germany (2025)