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Choi, P.; Cojocaru-Mirédin, O.; Abou-Ras, D.; Caballero, R.; Raabe, D.; Smentkowski, V.; Park, C. G.; Gu, G. H.; Mazumder, B.; Wong, M. H. et al.; Hu, Y.-L.; Melo, T. P.; Speck, J. S.: Atom-Probe Tomography of compound semiconductors for photovoltaic and light-emitting device applications. Microscopy Today 20 (3), pp. 18 - 24 (2012)

Choi, P.; Cojocaru-Mirédin, O.; Würz, R.; Raabe, D.: Comparative atom probe study of Cu(In,Ga)Se₂ thin-film solar cells deposited on soda-lime glass and mild steel substrates. Journal of Applied Physics 110 (12), 124513 (7pp) (2011)

Cojocaru-Mirédin, O.; Choi, P.; Abou-Ras, D.; Schmidt, S. S.; Caballero, R.; Raabe, D.: Characterization of grain boundaries in Cu(In,Ga)Se₂ films using atom probe tomography. Journal of Photovoltaics 1, pp. 207 - 212 (2011)

Cojocaru-Mirédin, O.; Choi, P.; Wuerz, R.; Raabe, D.: Atomic-scale characterization of the CdS/CuInSe₂ interface in thin-film solar cells. Applied Physics Letters 98, pp. 103504-1 - 103504-3 (2011)

Cojocaru-Mirédin, O.; Choi, P.; Wuerz, R.; Raabe, D.: Atomic-scale distribution of impurities in CuInSe₂-based thin-film solar cells. Ultramicroscopy 111 (6), pp. 552 - 556 (2011)

Hoffmann, V.; Klemm, D.; Brackmann, V.; Venzago, C.; Rockett, A. A.; Wirth, T.; Nunney, T. S.; Kaufmann, C. A.; Caballero, R.; Cojocaru-Mirédin, O.: Accessing Elemental Distributions in Thin Films for Solar Cells. In: Advanced Characterization Techniques for Thin Film Solar Cells: Second Edition, Vol. 2-2, pp. 523 - 567. wiley, Hoboken, NJ, USA (2016)

Liebscher, C.; Stoffers, A.; Cojocaru-Mirédin, O.; Gault, B.; Scheu, C.; Dehm, G.; Raabe, D.: Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT. In: Microscopy and Microanalysis, Vol. 22, pp. 46 - 47. 3rd Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016) , Saarbrücken, Germany, October 11, 2016 - October 12, 2016. (2016)

Soni, P. U.; Cojocaru-Mirédin, O.; Raabe, D.: Interface engineering and nanoscale characterization of Zn(S,O) alternative buffer layer for CIGS thin film solar cells. In: 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015, 7355889. 42nd Photovoltaic Specialist Conference, PVSC 2015, Category numberCFP15PSC-ART; Code 118514, New Orleans, LA, USA, June 14, 2015 - June 19, 2015. Institute of Electrical and Electronics Engineers Inc., Piscataway Township, NJ, USA (2015)

Koprek, A.; Cojocaru-Mirédin, O.; Würz, R.; Freysoldt, C.; Raabe, D.: Cd and impurity redistribution at the p-n junction of CIGS based solar cells resolved by atom-probe tomography. In: Photovoltaic Specialist Conference (PVSC), pp. 1 - 6 (Ed. IEEE ). Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd , New Orleans, LA, USA, June 14, 2015 - June 19, 2015. (2015)

Stoffers, A.; Cojocaru-Mirédin, O.; Breitenstein, O.; Seifert, W.; Zaefferer, S.; Raabe, D.: Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. In: 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014, 6925089, pp. 42 - 46. 40th IEEE Photovoltaic Specialist Conference, PVSC 2014, Denver, CO, USA, June 08, 2014 - June 13, 2014. (2014)

Schwarz, T.; Cojocaru-Mirédin, O.; Choi, P.-P.; Lämmle, A.; Würz, R.; Mousel, M.; Redinger, A.; Siebentritt, S.; Botti, S.; Raabe, D.: Nano-scale characterization of thin-film solar cells. In: Microscopy and Microanalysis, Vol. 20, pp. 394 - 395 (Eds. J.E., M.; D.C., B.; A., G.; Y.N., P.; J.P., S. et al.). Microscopy and Microanalysis 2014, M and M 2014, Hartford, CT, USA, August 03, 2014 - August 07, 2014. Cambridge University Press, New York, NY (2014)

Cojocaru-Mirédin, O.; Choi, P.; Wuerz, R.; Raabe, D.: Impurity segregation at CuInSe₂-based grain boundaries. Proceedings of 3rd Intern. Conf. "Adv. Comp. Mater. Eng.", Transilvania University, Brasov, Romania, 2010., (2010)

Scheu, C.; Abdellaoui, L.; Bueno Villoro, R.; Cojocaru-Mirédin, O.; Gault, B.; Luo, T.; Jung, C.; Yu, Y.; Zaefferer, S.; Zhang, S.: A scale bridging approach for analysis of extended defects in thermoelectric materials: From electron channeling contrast imaging, scanning transmission electron microscopy to atom probe tomography. ELMINA2022, Belgrade, Serbia (2022)

Abdellaoui, L.; Yu, Y.; Zhang, S.; Luo, T.; Chen, Z.; Bueno Villoro, R.; Hanus, R.; Cojocaru-Mirédin, O.; Snyder, G. J.; Raabe, D. et al.; Pei, Y.; Scheu, C.: Parallel Dislocation Networks and Cottrell Atmospheres Reduce Thermal Conductivity of PbTe Thermoelectrics. Virtual Thermoelectric Conference 2021 (VCT 2021) (2021)

Abdellaoui, L.; Yu, Y.; Zhang, S.; Bueno Villoro, R.; Luo, T.; Chen, Z.; Hanus, R.; Cojocaru-Mirédin, O.; Snyder, G. J.; Raabe, D. et al.; Pei, Y.; Scheu, C.: Detailed structure and chemistry of structural defects in PbTe based alloys. Virtual Thermoelectric Conference 2020 (VCT 2020) (2020)

Liebscher, C.; Stoffers, A.; Alam, M.; Lymperakis, L.; Cojocaru-Mirédin, O.; Gault, B.; Neugebauer, J.; Scheu, C.; Raabe, D.; Meiners, T. et al.; Frolov, T.; Dehm, G.: How do grain boundaries transform on the atomic level? International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano 2019, Düsseldorf, Germany (2019)

Abdellaoui, L.; Zhang, S.; Rodenkirchen, C.; Zaefferer, S.; Bueno Villoro, R.; Guen, E.; Chapuis, P.-O.; Gomès, S.; Cojocaru-Mirédin, O.; Yu, Y. et al.; Amouyal, Y.; Raabe, D.; Snyder, G. J.; Scheu, C.: Effect of planar defects on the thermal conductivity of Ag_16.7Sb₃₀Te_53.3 bulk thermoelectric. 6th German/Korean Thermoelectric workshop, Daegu, South Korea (2019)

Abdellaoui, L.; Zhang, S.; Rodenkirchen, C.; Zaefferer, S.; Bueno Villoro, R.; Cojocaru-Mirédin, O.; Yu, Y.; Amouyal, Y.; Raabe, D.; Snyder, G. J. et al.; Scheu, C.: The importance of crystallographic defects in Ag_16.7Sb₃₀Te_53.3 thermoelectric bulk materials for the thermoelectric properties. EBSD conference 2019, National Physical Laboratory, Teddington, London, UK (2019)

Liebscher, C.; Stoffers, A.; Alam, M.; Lymperakis, L.; Cojocaru-Mirédin, O.; Gault, B.; Neugebauer, J.; Dehm, G.; Scheu, C.; Raabe, D.: Asymmetric Line Segregation at Faceted Si Grain Boundaries. TMS 2019 Annual Meeting & Exhibition, San Antonio, TX, USA (2019)

Abdellaoui, L.; Zhang, S.; Rodenkirchen, C.; Zaefferer, S.; Bueno Villoro, R.; Guen, E.; Chapuis, P.-O.; Gomès, S.; Cojocaru-Mirédin, O.; Yu, Y. et al.; Amouyal, Y.; Raabe, D.; Snyder, G. J.; Scheu, C.: Correlation of Microstructures and Thermal Conductivity of the Thermoelectric Material Ag_16.7Sb₃₀Te_53.3. North American Thermoelectric workshop, Northwestern University, Eanston, Chicago, IL, USA (2019)