Salgin, B.; Hamou, F. R.; Rohwerder, M.: Monitoring surface ion mobility on aluminum oxide: Effect of chemical pretreatments. Electrochimica Acta 110, pp. 526 - 533 (2013)

Nesselberger, M.; Roefzaad, M.; Hamou, F. R.; Biedermann, P. U.; Schweinberger, F. F.; Kunz, S.; Schloegl, K.; Wiberg, G. K. H.; Ashton, S.; Heiz, U. et al.; Mayrhofer, K. J. J.; Arenz, M.: The effect of particle proximity on the oxygen reduction rate of size-selected platinum clusters. Nature Materials 12 (10), pp. 919 - 924 (2013)

Hamou, F. R.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical analysis of Debye screening effect in electrode surface potential mapping by scanning electrochemical potential microscopy. Electrochemistry Communucations 12 (10), pp. 1391 - 1394 (2010)

Hamou, F. R.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy. Electrochimica Acta 55 (18), pp. 5210 - 5222 (2010)

Hamou, R. F.; Macdonald, J. R.; Tuncer, E.: Dispersive dielectric and conductive effects in 2D resistor-capacitor networks. Journal of Physics-Condensed Matter 21 (2), 025904 (13pp) (2009)

Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical Investigation of Electrode Surface Potential Mapping with Scanning Electrochemical Potential Microscopy. The 12th International Scanning Probe Microscopy Conference, Sapporo, Japan (2010)

Bashir, A.; Muglali, M. I.; Hamou, R. F.; Rohwerder, M.: SECPM Study: Influence of the Tip Material and Its Coating on the Accuracy of Potential Profiling Across Electrical Double Layer at Solid/Liquid Interface. 217th ECS Meeting, Vancouver, Canada (2010)

Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical simulation of probing the electric double layer by scanning electrochemical Potential microscopy. 217th ECS Meeting, Vancouver, Canada (2010)

Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy. International Workshops on Surface Modification for Chemical and Biochemical Sensing, Przegorzaly, Poland (2009)

Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Screening effects in probing the double layer by scanning electrochemical potential microscopy. Comsol European Conference October 2009, Milan, Italy (2009)

Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Simulation of probing the electric double layer by scanning electrochemical potential microscopy (SECPM). 11th International Fischer Symposium on Microscopy in Electrochemistry, Benediktbeuern, Germany (2009)

Hamou, R. F.; Biedermann, P. U.; Rohwerder, M.; Blumenau, A. T.: FEM Simulation of the Scanning Electrochemical Potential Microscopy (SECPM). Comsol European Conference 2008, Hannover, Germany (2008)

Hamou, R. F.; Biedermann, P. U.; Blumenau, A. T.: FEM Simulation of the Scanning Electrochemical Potential Microscopy (SECPM). SurMat Seminar, Schloß Gnadenthal, Kleve, Germany (2008)

Hamou, R. F.; Erbe, A.; Rohwerder, M.: Screening effects in probing the double layer by scanning electrochemical potential microscopy. Comsol European Conference October 2009, Milan, Italy (2009)

Hamou, R. F.; Biedermann, P. U.; Rohwerder, M.; Blumenau, A. T.: FEM Simulation of the Scanning Electrochemical Potential Microscopy (SECPM). 2nd IMPRS-SurMat Workshop in Surface and Interface Engineering in Advanced Materials, Ruhr-Universität Bochum, Bochum, Germany (2008)

Hamou, F. R.: Numerical Investigation of Scanning Electrochemical Potential Microscopy (SECPM). Dissertation, Fakultät für Physik und Astronomie der Ruhr-Universität, Bochum, Germany (2010)