Scanning transmission electron microscopy (STEM) has become an increasingly versatile and sophisticated instrument for studying materials at the atomic scale, due to advancements in in situ capabilities, novel imaging and spectroscopy modalities and ultrafast detectors. The large multidimensional datasets that are produced are enormously rich in quantitative information about the sample, but they call for new approaches in terms of data and metadata management. At present, the multitude of proprietary data formats developed by instrument manufacturers hinder easy access to the raw data. Each format also has their own metadata representation. In light of FAIR (Findable, Accessible, Interoperable, Reusable) principles, it is becoming increasingly important to standardize (meta)data representation.
The goal of this project is to develop universal, instrument and experiment independent TEM data and metadata formats.