Invited Speakers

Invited Speakers 2020

Invited Speakers 2019

Using analytical electron microscopy to study microstructural evolution and its effect on structural & functional properties

Using analytical electron microscopy to study microstructural evolution and its effect on structural & functional properties
  • Date: Jul 19, 2019
  • Time: 11:00 AM - 12:00 PM (Local Time Germany)
  • Speaker: Dr. Yolita M. Eggeler
  • Dep. of Materials Science, University of California, Santa Barbara
  • Location: Max-Planck-Institut für Eisenforschung GmbH
  • Room: Large Conference Room No. 203
  • Host: Prof. Gerhard Dehm
Analytical electron microscopy is applied to study elementary processes which govern micro- and nanostructural evolution and their effect on structural and functional properties in two-phase material ... [more]

Micromechanics of bone: fundamental research and clinical applications

Micromechanics of bone: fundamental research and clinical applications
  • Date: May 17, 2019
  • Time: 10:00 AM - 11:00 AM (Local Time Germany)
  • Speaker: Dr. Jakob Schwiedrzik
  • Empa - Swiss Federal Laboratories for Materials Science and Technology, 3602 Thun, Switzerland
  • Location: Max-Planck-Institut für Eisenforschung GmbH
  • Room: Large Conference Room No. 203
  • Host: Prof. Gerhard Dehm
In this talk, the work within the Biomechanics Research Team at the Laboratory for Mechanics of Materials and Nanostructures of Empa on micromechanics of bone will be presented. Fundamental research ... [more]

Aberration-corrected STEM and ultra-high energy resolution EELS

Aberration-corrected STEM and ultra-high energy resolution EELS
  • Date: May 6, 2019
  • Time: 11:00 AM - 12:00 PM (Local Time Germany)
  • Speaker: Dr. Ondrej L. Krivanek
  • Nion R&D, 11515 NE 118th St., Kirkland, WA 98034, USA Department of Physics, Arizona State University, Tempe, Arizona, USA
  • Location: Max-Planck-Institut für Eisenforschung GmbH
  • Room: Large Conference Room No. 203
  • Host: Prof. Gerhard Dehm
Electron microscopy has advanced very significantly in the last two decades. Electron-optical correction of aberrations, which we introduced for the scanning transmission electron microscope (STEM) ... [more]
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