Invited Speakers
We have invited experts who undertake exciting research in one or more of the following areas:
- atom probe tomography
- field-ion microscopy
- electrochemistry
to discuss possibilities, requirements, and challenges for the effective modeling of electric fields across a wide range.
Speakers have been asked to give 60-minutes tutorial like presentations.
Topic: Electric Fields at Solid-Liquid Interfaces
- Giulia Galli, University of Chicago, Illinois (USA)
- François Gygi, University of California, Davis (USA)
- Richard Hennig, University of Florida (USA)
- Jan Rossmeisl, University of Copenhagen (DK)
- Eckhard Spohr, Universität Essen-Duisburg (D)
Topic: Electric Fields at Surfaces/Atom probe tomography:
- Christoph Freysoldt, MPIE Düsseldorf (D)
- Guido Schmitz, Universität Stuttgart (D)
- Wolfgang Windl, Ohio State University (USA)
- Chris Van de Walle, UCSB, California (USA)
- François Vurpillot, Université de Rouen (F)