Publications

Stoffers, A.; Cojocaru-Mirédin, O.; Seifert, W.; Zaefferer, S.; Riepe, S.; Raabe, D.: Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography. Progress in Photovoltaics: Research and Applications 23 (12), pp. 1742 - 1753 (2015)

Konijnenberg, P. J.; Zaefferer, S.; Raabe, D.: Assessment of geometrically necessary dislocation levels derived by 3D EBSD. Acta Materialia 99, pp. 402 - 414 (2015)

Rowenhorst, D.; Rollett, A.; Rohrer, G.; Groeber, M.; Jackson, M.; Konijnenberg, P. J.; De Graef, M.: Consistent representations of and conversions between 3D rotations. Modeling and Simulations in Materials Science and Engineering 23 (8), 083501 (2015)

Renner, F. U.; Ankah, G. N.; Bashir, A.; Ma, D.; Biedermann, P. U.; Shrestha, B. R.; Nellessen, M.; Khorashadizadeh, A.; Losada-Pérez, P.; Duarte, M. J. et al.; Raabe, D.; Valtiner, M.: Self-Assembled Monolayers: Star-Shaped Crystallographic Cracking of Localized Nanoporous Defects (Adv. Mater. 33/2015). Advanced Materials 27 (33), p. 4947 - 4947 (2015)

Renner, F. U.; Ankah, G. N.; Bashir, A.; Ma, D.; Biedermann, P. U.; Shrestha, B. R.; Nellessen, M.; Khorashadizadeh, A.; Losada-Pérez, P.; Duarte, M. J. et al.; Raabe, D.; Valtiner, M.: Star-Shaped Crystallographic Cracking of Localized Nanoporous Defects. Advanced Materials 27, pp. 4877 - 4882 (2015)

Schemmann, L.; Zaefferer, S.; Raabe, D.; Friedel, F.; Mattissen, D.: Alloying effects on microstructure formation of dual phase steels. Acta Materialia 95, pp. 386 - 398 (2015)

Zhang, J.; Zaefferer, S.; Raabe, D.: A study on the geometry of dislocation patterns in the surrounding of nanoindents in a TWIP steel using electron channeling contrast imaging and discrete dislocation dynamics simulations. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing 636, pp. 231 - 242 (2015)

Ram, F.; Zaefferer, S.; Jäpel, T.; Raabe, D.: Error analysis of the crystal orientations and disorientations obtained by the classical electron backscatter diffraction technique. Journal of Applied Crystallography 48 (3), pp. 797 - 813 (2015)

Afshar, M.; Zaefferer, S.: A pseudo-3D approach based on electron backscatter diffraction and backscatter electron imaging to study the character of phase boundaries between Mg and long period stacking ordered phase in a Mg–2Y–Zn alloy. Materials Characterization 101, pp. 130 - 135 (2015)

Zaefferer, S.; Wright, S. I.; Konijnenberg, P. J.: 3D EBSD. In: EBSD: Analyse par diffraction des électrons rétrodiffusés, pp. 159 - 184 (Ed. François, B.). François, B., GN-MEBA, Paris, France (2015)

Zaefferer, S.: State of the art of electron backscatter diffraction (EBSD). EMAS 2015 - 14th European Workshop on Modern Developments and Applications in Microbeam Analysis: Book of Tutorials and Abstracts, Portorož, Slovenia, May 03, 2015 - May 07, 2015. EMAS 2015 - 14th European Workshop on Modern Developments and Applications in Microbeam Analysis: Book of Tutorials and Abstracts, pp. 247 - 271 (2015)

Zaefferer, S.; Stechmann, G.: Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells. In: Tagungsband des EFDS Workshops “Morphologie und Mikrostruktur Dünner Schichten und deren Beeinflussung” (Ed. Wetzig, K.). EFDS Workshop “Morphologie und Mikrostruktur Dünner Schichten und deren Beeinflussung”, Dresden, Germany, March 12, 2015. (2015)

Archie, F. M. F.; Zaefferer, S.: Strength and fracture toughness of AHSS: Influence of Grain and Interphase Boundaries. EUROMAT 2015, Warsaw, Poland (2015)

Mandal, S.; Pradeep, K. G.; Zaefferer, S.; Konijnenberg, P. J.; Raabe, D.: Linking crystallography with property: towards comprehensive characterization of grain boundaries. ICOTOM 17, Dresden, Germany (2015)

Zaefferer, S.: Measurement of electronic, chemical and mechanical properties of individual grain boundaries. ICOTOM 17; invited tutorial, Dresden, Germany (2015)

Zaefferer, S.; Ram, F.; Mandal, S.; Raabe, D.: Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by scanning electron microscopy-based diffraction techniques. ICOTOM 17; invited plenary, Dresden, Germany (2015)

Zaefferer, S.: SEM-based diffraction techniques for the study of deformation structures in metals. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, Hamburg, Germany (2015)

Zaefferer, S.; Archie, F. M. F.: Crystallographic and mechanical charactization of micro-bicrystal cantilevers. ICM 2015, Karlsruhe, Germany (2015)

Zaefferer, S.: State of the art of EBSD. EMAS 2015, Portoroz, Slovenia (2015)

Zaefferer, S.: Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by SEM-based diffraction techniques. Talk at Universität Bayreuth, Bayreuth, Germany (2015)