Li, Z.; Ram, F.; Zaefferer, S.; Raabe, D.; Reed, R. C.: Investigations of dislocation structures in a Ni-based single crystal superalloy using Electron Channeling Contrast Imaging (ECCI) and cross-correlation EBSD. RMS EBSD, Glasgow, Scotland, UK (2015)

Stechmann, G.; Zaefferer, S.: 3-dimensionnal Microstructural Characterization of CdTe-based Solar Cells. Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg, Stuttgart, Germany (2015)

Zaefferer, S.; Stechmann, G.: Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells. Workshop Morphologie und Mikrostruktur dünner Schichten, Dresden, Germany (2015)

Zaefferer, S.: Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by SEM-based diffraction techniques. Deutsche Nanoschicht, Bonn, Germany (2015)

Stechmann, G.; Zaefferer, S.: Microstructural and Electronic Characterization of CdTe Thin Film Solar Cells: A Correlative SEM-Based Approach. IAMNano, Hamburg, Germany (2015)

Archie, F. M. F.; Zaefferer, S.: Strain Localization in DP Steels: Influence of Grain and Interphase Boundaries. GLADD Meeting, Leuven, Belgium (2015)

Zaefferer, S.; Hickel, T.; Prahl, U.: Microstructures, Microscopy & Modelling. Lecture: Masterstudiengang, SS 2015, RWTH Aachen, Aachen, Germany, April 01, 2015 - September 30, 2015

Ram, F.: The Kikuchi bandlet method for the intensity analysis of the Electron Backscatter Kikuchi Diffraction Patterns. Dissertation, RWTH Aachen, Aachen, Germany (2015)