Zaefferer, S.: Quantitative analysis of crystal defects by means of EBSD and related methods. Arbeitskreistreffen: Mikrostrukturcharakterisierung im REM, Düsseldorf, Germany (2014)

Zaefferer, S.: Application of EBSD and ECCI for the Investigation of Microstructures of Engineering Materials. MSA EBSD 2014, Pittsburgh, PA, USA (2014)

Zaefferer, S.: Application of diffraction techniques in the scanning electron microscope for the investigation of microstructures of engineering materials. Deutsche Versuchsanstalt für Luft und Raumfahrt (DLR), Köln, Germany (2014)

Stechmann, G.; Zaefferer, S.; Konijnenberg, P. J.; Raabe, D.; Gretener, C.; Kranz, L.; Perrenoud, J.; Bücheler, S.; Tiwari, A. N.: 3-Dimensional Microstructural and Crystallographic Characterization of CdTe Absorber Layers from CdTe/CdS Solar Cells Grown in Substrate Configuration. E-MRS, European Materials Research Society Conference 2014 , Lille, France (2014)

Konijnenberg, P. J.; Zaefferer, S.: GND Analysis of a Copper Micro Cantilever Beam. RMS EBSD 2014, London, UK (2014)

Herbig, M.; Raabe, D.; Li, Y.; Choi, P.; Zaefferer, S.; Goto, S.: High Throughput Quantification of Grain Boundary Segregation by Correlative TEM and APT. TMS 2014, Solid-State Interfaces III Symposium, San Diego, CA, USA (2014)

Herbig, M.; Raabe, D.; Li, Y.; Choi, P.-P.; Zaefferer, S.; Goto, S.: High Throughput Quantification of Grain Boundary Segregation by Correlative Transmission Electron Microscopy and Atom Probe Tomography. International Conference on Atom Probe Tomography & Microscopy 2014, Stuttgart, Germany (2014)

Konijnenberg, P. J.; Stechmann, G.; Zaefferer, S.; Raabe, D.: Advances in Analysis of 3D Orientation Data Sets Obtained by FIB-EBSD Tomography. 2nd International Congress on 3D Materials Science 2014, Annecy, France (2014)

Konijnenberg, P. J.; Zaefferer, S.; Raabe, D.: GND Analysis of a Copper Micro Cantilever Beam. Arbeitskreis EBSD 2014, Düsseldorf, Germany (2014)

Ram, F.: Have we resorted to red herrings to justify our hasty generalizations in materials science? PhD Science Slam, VISIONS IN SCIENCE, Berlin, Germany (2014)

Ram, F.; Khorashadizadeh, A.; Zaefferer, S.: Kikuchi Band Sharpness: A Measure for the Density of the Crystal Lattice Defects. MSE 2014, Darmstadt, Germany (2014)

Ram, F.; Zaefferer, S.: Accurate Kikuchi band localization and its application for diffraction geometry determination. HR-EBSD workshop, Imperial College, London, UK (2014)

Ram, F.; Zaefferer, S.: Plastic strain derivation and Kikuchi band localization by applying the Kikuchi bandlet method to electron backscatter Kikuchi Diffraction patterns. 17th ICOTOM, Dresden; Germany (2014)

Schemmann, L.; Zaefferer, S.: New insights into ferrite in dual phase steels by the usage of EBSD. EBSD 2014, London, UK (2014)

Stoffers, A.; Cojocaru-Mirédin, O.; Breitenstein, O.; Seifert, W.; Zaefferer, S.; Raabe, D.: Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. 40th IEEE Photovoltaic Specialists Conference, Denver, CO, USA (2014)

Stoffers, A.; Cojocaru-Mirédin, O.; Seifert, W.; Zaefferer, S.; Raabe, D.: A correlative EBSD, EBIC and APT study of grain boundary segregation in multicrystalline silicon. Atom Probe Tomography & Microscopy 2014, Stuttgart, Germany (2014)

Zaefferer, S.: SEM and TEM based orientation microscopy for investigation of recrystallization processes. CNRS summer school on recrystallization, Frejus, France (2014)

Zaefferer, S.; Ram, F.: The Kikuchi bandlet method: Application to plastic and elastic strain measurements. MSA EBSD 2014, Pittsburgh, USA (2014)

Zaefferer, S.; Zhu, Z.; Reed, R. C.: Observation of Dislocation Evolution during Straining of a γ-γ’ Superalloy Single Crystal using the CECCI technique. Eurosuperalloys 2014, Giens, France (2014)

Archie, F. M. F.; Zaefferer, S.; Raabe, D.: The influence of grain boundary character on dislocation densities and fracture toughness in AHSS. M2i Conference "High Tech Materials: your world - our business", Sint Michielgestel, The Netherlands (2014)