Dehm, G.; Jaya, B. N.; Raghavan, R.; Kirchlechner, C.: Probing deformation and fracture of materials with high spatial resolution. Euromat 2015 - Symposium on In-situ Micro- and Nano-mechanical, Characterization and Size Effects
, Warsaw, Poland (2015)
Dehm, G.: In situ nano- and micromechanics of materials. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices – IAMNano 2015, Hamburg, Germany (2015)
Duarte, M. J.; Brinckmann, S.; Renner, F. U.; Dehm, G.: Nanomechanical testing under environmental conditins of Fe-based metallic glasses. 22st International Symposium on Metastable Amorphous and Nanostructured Materials, ISMANAM 2015, Paris, France (2015)
Hieke, S. W.; Dehm, G.; Scheu, C.: Temperature induced faceted hole formation in epitaxial Al thin films on sapphire. Understanding Grain Boundary Migration: Theory Meets Experiment, Günzburg/Donau, Germany (2015)
Malyar, N.; Kirchlechner, C.; Dehm, G.: Dislocation grain boundary interaction in bi-crystalline micro pillars studied by in situ SEM and in situ µLaue diffraction. ICM 12 - 12th International Conference on the Mechanical Behavior of Materials, Karlsruhe, Germany (2015)
Dehm, G.: In situ nanocompression testing in the TEM: Challenges and benefits. Symposium Advanced Electron Microscopy for Materials Research, Erlangen, Germany (2015)
Kirchlechner, C.; Malyar, N.; Imrich, P. J.; Dehm, G.: Plastische Verformung an Korngrenzen: Neue Einblicke durch miniaturisierte Zug- und Druckversuche. 11. Tagung Gefüge und Bruch (2015), Leoben, Austria (2015)
Fink, C.; Brinckmann, S.; Shin, S.; Dehm, G.: Nanotribology and Microstructure Evolution in Pearlite. Frühjahrstagung der Sektion Kondensierte Materie der Deutschen Physikalischen Gesellschaft
, Berlin, Germany (2015)
Malyar, N.; Dehm, G.; Kirchlechner, C.: Insights into dislocation slip transfer by µLaue diffraction. Arbeitskreis-Treffen der Deutschen Gesellschaft für Materialkunde (DGM) e.V. „Rasterkraftmikroskopie und nanomechanische Methoden“, Darmstadt, Germany (2015)
Marx, V. M.; Kirchlechner, C.; Cordill, M. J.; Dehm, G.: The mechanical behavior of thin cobalt films on polyimide. Arbeitskreistreffen Rasterkraftmikroskopie und nanomechanische Methoden, TU Darmstadt, Darmstadt, Germny (2015)
Dehm, G.: Structure and Nano-/Micromechanics of Materials. Chemisch-Physikalisch-Technische Sektion der Max-Planck-Gesellschaft, Berlin, Germany (2015)
Dehm, G.: New Insights into Materials Phenomena by Advanced TEM. Symposium: Advanced Materials Analysis by latest STEM Technologies, Mülheim an der Ruhr, Germany (2015)
Brinckmann, S.; Fink, C.; Dehm, G.: Roughness and Microstructure Development during Nanotribology in Austenite. DPG-Spring Meeting, Berlin, Germany (2015)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Integrated Computational Materials Engineering (ICME) is one of the emerging hot topics in Computational Materials Simulation during the last years. It aims at the integration of simulation tools at different length scales and along the processing chain to predict and optimize final component properties.
Data-rich experiments such as scanning transmission electron microscopy (STEM) provide large amounts of multi-dimensional raw data that encodes, via correlations or hierarchical patterns, much of the underlying materials physics. With modern instrumentation, data generation tends to be faster than human analysis, and the full information content is…
The project’s goal is to synergize experimental phase transformations dynamics, observed via scanning transmission electron microscopy, with phase-field models that will enable us to learn the continuum description of complex material systems directly from experiment.
In order to prepare raw data from scanning transmission electron microscopy for analysis, pattern detection algorithms are developed that allow to identify automatically higher-order feature such as crystalline grains, lattice defects, etc. from atomically resolved measurements.