Schwarz, T.; Cojocaru-Mirédin, O.; Choi, P.; Würz, R.: Atomic-scale analysis of Cu(In,Ga)Se2 grain boundaries. 27th European Photovoltaic Solar Energy Conference and Exhibition, Frankfurt a. M., Germany (2012)
Schwarz, T.; Cojocaru-Mirédin, O.; Choi, P.; Würz, R.: Study of impurities redistribution inside the cigs absorber layer by atom probe tomography. Photovoltaic Technical Conference - Thin Film & Advanced Silicon Solutions 2012 (PVTC 2012), Aix-en-Provence, France (2012)
Cojocaru-Mirédin, O.; Choi, P.; Schwarz, T.; Würz, R.; Raabe, D.: Exploring the internal interfaces at the atomic-scale in CIGS thin-films solar cells. DPG-Frühjahrstagung Modern, Atom Probe Tomography, TU Berlin, Germany (2012)
Cojocaru-Mirédin, O.; Schwarz, T.; Choi, P.; Würz, R.; Raabe, D.: Exploring the internal interfaces at the atomic-scale in thin-film solar cells. Seminar Talk at Helmholtz Zentrum Berlin (HZB), Berlin, Germany (2012)
Changizi, R.; Lim, J.; Zhang, S.; Schwarz, T.; Scheu, C.: Characterization of KCa2Nb3O10. IAMNano 2019, International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, Düsseldorf, Germany (2019)
Changizi, R.; Zhang, S.; Schwarz, T.; Scheu, C.: Cathodoluminescence and the structural study of Lanthanide-doped oxides. Workshop on Transmission Electron Microscopy (E-MAT), Antwerp, Belgium (2019)
Changizi, R.; Zhang, S.; Schwarz, T.; Scheu, C.: Study of the chemical composition and the luminescent spectra of Lanthanide-doped oxides. E-MRS 2019 Spring Meeting, Nice, France (2019)
Cojocaru-Mirédin, O.; Schwarz, T.; Choi, P.; Würz, R.; Raabe, D.: Characterization of Cu(In,Ga)Se2 grain boundaries using atom probe tomography. 2013 MRS Spring Meeting & Exhibit, San Francisco, CA, USA (2013)
Max Planck scientists design a process that merges metal extraction, alloying and processing into one single, eco-friendly step. Their results are now published in the journal Nature.
The aim of the work is to develop instrumentation, methodology and protocols to extract the dynamic strength and hardness of micro-/nano- scale materials at high strain rates using an in situ nanomechanical tester capable of indentation up to constant strain rates of up to 100000 s−1.