Publications of Baptiste Gault

Peng, Z.; Rohwerder, M.; Friedrichs, M.; Choi, P.-P.; Gault, B.; Meiners, T.; Kreilkamp, H.; Klocke, F.; Raabe, D.: Degradation Mechanism of Molds for Precision Glass Molding. In: MicroscopyMicroanalysis, Vol. 23, pp. 698 - 699. Microscopy & Microanalysis 2017, St. Louis, MO, USA, August 06, 2017 - August 10, 2017. (2017)

Liebscher, C.; Stoffers, A.; Cojocaru-Mirédin, O.; Gault, B.; Scheu, C.; Dehm, G.; Raabe, D.: Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT. In: Microscopy and Microanalysis, Vol. 22, pp. 46 - 47. 3rd Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016) , Saarbrücken, Germany, October 11, 2016 - October 12, 2016. (2016)

El-Zoka, A.; Kim, S.-H.; Khanchandani, H.; Stephenson, L.; Gault, B.: Advances in Cryo-Atom Probe Tomography Studies on Formation of Nanoporous Metals by Dealloying (Digital Presentation). In ECS Meeting Abstracts, MA2022-01 (47), p. 1983. The Electrochemical Society (2022)

Schweinar, K.; Gault, B.; Greiner, M.; Raabe, D.; Kasian, O.: Atomic-Scale View into the Degradation of Ir-Ru Alloys during Anodic Oxygen Evolution. In ECS Meeting Abstracts, MA2020-01 (37), 1520. 237th ECS Meeting, Montréal, Canada, May 10, 2020 - May 14, 2020. (2020)

Scheu, C.; Bueno Villoro, R.; Abdellaoui, L.; Mattlat, D. A.; Jung, C.; Gault, B.; Zhang, S.: New insights into thermoelectric materials through length-bridging characterization. Transverse Effects in Thermoelectric Systems 819. WE-Heraeus-Seminar, Bad Honnef, Germany (2024)

Freysoldt, C.; Saxena, A.; Wang, N.; Sreekala, L.; Saikia, U.; Gault, B.; Liebscher, C.: Automated Analysis of data-rich experiments for microstructure imaging. Material Science and Engineering 2024 (MSE24), Darmstadt, Germany (2024)

Schwarz, T.; Shoji Aota, L.; Woods, E.; Zhou, X.; McCarroll, I.; Gault, B.: cryo-atom probe tomography; quasi-'in situ' analysis of the reactive liquid-solid interface during Mg corrosion. 16th Biometal 2024 Symposium, Krakow, Poland (2024)

Schwarz, T.; Shoji Aota, L.; Woods, E.; Zhou, X.; McCaroll, I.; Gault, B.: cryo-atom probe tomography; quasi-'in situ' analysis of the reactive liquid-solid interface during Mg corrosion. 9th NRW-APT user meeting, MPIE, Düsseldorf, Germany (2024)

Saxena, A.; Polin, N.; Kühbach, M. T.; Katnagallu, S.; Kontis, P.; Gault, B.; Freysoldt, C.: A Machine Learning based Workflows to Quantify Atom Probe Tomography Data. Workshop "Frontiers of APT Physics, Data Processing, Analysis and Reconstruction“, Arlington, VA, USA (2024)

Zhou, X.; Hickel, T.; Gault, B.; Ophus, C.; Liebscher, C.; Dehm, G.; Raabe, D.: Exploring the Relationship Between Grain Boundary Structure and Chemical Composition at the Atomic Level. International Conference on Intergranular and Interphase Boundaries in Materials (IIB 2024), Beijing, China (2024)

Krämer, M.; Favelukis, B.; El-Zoka, A.; Sokol, M.; A. Rosen, B.; Eliaz, N.; Kim, S.-H.; Gault, B.: Compositional mapping of 2D MXenes at the near-atomic-scale by atom probe tomography. EUROMXENE Congress 2024, Valencia, Spain (2024)

Aota, L. S.; Jung, C.; Zhang, S.; Büyükuslu, Ö.; Singh, M. P.; Chen, X.; Woods, E.; Scheu, C.; Kim, S.-H.; Raabe, D. et al.; Gault, B.: Grain boundary-controlled lithiation of Li-solid solution systems for lithium metal batteries. International Operando Battery Days, Grenoble, France (2024)

Hatipoglu, E.; Saksena, A.; Michael Schneider, J.; Gault, B.; El-Zoka, A.: Development of Thin-Film Nanoporous Ruthenium Electrocatalysts Using Atom Probe Tomography. 245th The Electrochemical Scoiety (ECS) Meeting, San Francisco, CL, USA (2024)

Li, Y.; Gault, B.: Machine learning-enabled tomographic imaging of chemical short-range ordering in CoCrNi alloy. TMS 2023, San Diego, CA, USA (2024)

Li, Y.; Gault, B.: Machine Learning-enabled Tomographic Imaging of Chemical Short-range Order in Fe-based Solid-solutions. DPG 2024, Berlin, Germany (2024)

Li, Y.; Gault, B.: Machine Learning-enabled Tomographic Imaging of Chemical Short-range Order in Fe-based Solid-solutions. TMS 2024, Orlando, FL, USA (2024)

Zhou, X.; Ahmadian, A.; Hickel, T.; Gault, B.; Ophus, C.; Liebscher, C.; Dehm, G.; Raabe, D.: Atomic Scale Analysis Reveals the Interplay between Grain Boundary Structure and Composition. MRS 2023, Boston, MA, USA (2023)

Woods, E.; Aota, L. S.; Schwarz, T.; Kim, S.-H.; Douglas, J. O.; Singh, M. P.; Gault, B.: In-situ cryogenic protective layers and metal coatings in cryogenic FIB. IMC20 - 20th International Microscopy Congress - Pre-congress workshop, Cryogenic Atom Probe Tomography, Busan, South Korea (2023)

Hatipoglu, E.; Saksena, A.; Michael Schneider, J.; Gault, B.; El-Zoka, A.: Probing Dealloying Mechanisms in Thin-Film Nanoporous Metals Using Atom Probe Tomography. Atom Probe Tomography & Microscopy, Leuven, Belgium (2023)

Li, Y.; Gault, B.: Machine learning-enabled tomographic imaging of chemical short-range ordering in CoCrNi alloys. APT&M 2023, Leuven, Belgium (2023)