Zaefferer, S.: SEM-based diffraction techniques for the study of deformation structures in metals. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, Hamburg, Germany (2015)
Zaefferer, S.: Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by SEM-based diffraction techniques. Talk at Universität Bayreuth, Bayreuth, Germany (2015)
Li, Z.; Ram, F.; Zaefferer, S.; Raabe, D.; Reed, R. C.: Investigations of dislocation structures in a Ni-based single crystal superalloy using Electron Channeling Contrast Imaging (ECCI) and cross-correlation EBSD. RMS EBSD, Glasgow, Scotland, UK (2015)
Stechmann, G.; Zaefferer, S.: 3-dimensionnal Microstructural Characterization of CdTe-based Solar Cells. Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg, Stuttgart, Germany (2015)
Zaefferer, S.; Stechmann, G.: Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells. Workshop Morphologie und Mikrostruktur dünner Schichten, Dresden, Germany (2015)
Zaefferer, S.: Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by SEM-based diffraction techniques. Deutsche Nanoschicht, Bonn, Germany (2015)
Haghighat, S. M. H.; Li, Z.; Zaefferer, S.; Reed, R. C.; Raabe, D.: Mesoscale modeling of dislocation climb and primary creep process in single crystal Ni base superalloys. International Workshop on Dislocation Dynamics Simulations, Saclay, France (2014)
Zaefferer, S.: Quantitative Analyse von Kristalldefekten in Werkstoffen mittels Beugungsmethoden im Rasterelektronenmikroskop. Workshop in honour of Professor Füting, Hochschule Köthen, Köthen, Germany (2014)
Herbig, M.; Raabe, D.; Li, Y.; Choi, P.-P.; Zaefferer, S.; Goto, S.: Joint crystallographic and chemical characterization at the nanometer scale by correlative TEM and atom probe tomography. Workshop: White-etching layers in ball and roller bearings, Informatik-Zentrum Hörn, Aachen, Germany (2014)
Zaefferer, S.: Texture and microstructures of thin film solar cells. Autumn School on Microstructural Characterization and Modelling of Thin-Film Solar Cells, Potsdam, Germany (2014)
Haghighat, S. M. H.; Li, Z.; Zaefferer, S.; Reed, R. C.; Raabe, D.: Characterization and modeling of the propagation of creep dislocations from the interdendritic boundaries in single crystal Ni base superalloys. International Workshop on Modelling and Simulation of Superalloys, Bochum, Germany (2014)
Zaefferer, S.; Mandal, S.; Bozzolo, N.: Correlative Measurement of the 5-parameter Grain Boundary Character and its Physical and Chemical Properties. MSE 2014, Darmstadt, Germany (2014)
Schemmann, L.; Romano Triguero, P.; Zaefferer, S.: Eine Untersuchung zur ferritisch-bainitischen Umwandlung in einem Dualphasenstahl unter Verwendung von EBSD-basierten Misorientierungsmessungen. Arbeitskreistreffen: Mikrostrukturcharakterisierung im REM, Düsseldorf, Germany (2014)
Zaefferer, S.: Quantitative analysis of crystal defects by means of EBSD and related methods. Arbeitskreistreffen: Mikrostrukturcharakterisierung im REM, Düsseldorf, Germany (2014)
New machine learning framework makes metal recycling more sustainable without compromising on mechanical properties. Results now published in journal Science Advances.
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Ever since the discovery of electricity, chemical reactions occurring at the interface between a solid electrode and an aqueous solution have aroused great scientific interest, not least by the opportunity to influence and control the reactions by applying a voltage across the interface. Our current textbook knowledge is mostly based on mesoscopic…
Recent developments in experimental techniques and computer simulations provided the basis to achieve many of the breakthroughs in understanding materials down to the atomic scale. While extremely powerful, these techniques produce more and more complex data, forcing all departments to develop advanced data management and analysis tools as well as…