Motz, C.; Kiener, D.; Schöberl, T.; Pippan, R.; Dehm, G.: Sekundärionen-Massenspektroskopie (SIMS) mittels FIB. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Ed., pp. 1 - 311 (Ed. Rom, W.). W. Rom, Graz, Austria (2005)

Motz, C.; Kiener, D.; Schöberl, T.; Pippan, R.; Dehm, G.: Fokussierte Ionenstrahl-Technik (FIB) in der Mikro- und Nanomechanik. In: Handbuch der Nanoanalytik Steiermark, NanoNet Styria, 1 Ed., pp. 1 - 311 (Ed. Rom, W.). W. Rom, Graz, Austria (2005)

Motz, C.; Kiener, D.; Kirchlechner, C.; Grosinger, W.; Pippan, R.; Dehm, G.: Advances in in-situ testing in scanning electron microscopes: probing mechanical properties at the nano/micro-scale. In: 10th Multinational Congress on Microscopy (MCM 2011), pp. 57 - 58. 10th Multinational Congress on Microscopy (MCM 2011). (2011)

Yang, B.; Motz, C.; Grosinger, W.; Dehm, G.: Cyclic loading behavior of micro-sized polycrystalline copper wires. 10th International Fatigue Congress, FATIGUE 2010, Prague, Czech Republic, June 06, 2010 - June 11, 2010. Procedia Engineering 2 (1), pp. 925 - 930 (2010)

Motz, C.; Kiener, D.; Kirchlechner, C.; Matoy, K.; Wurster, S.; Dehm, G.; Pippan, R.: Determination of micro-mechanical properties: In-situ compression, tension and fracture testing within the SEM. In: 9th Multinational Microscopy Conference 2009, pp. 501 - 502 (Eds. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, August 30, 2009 - September 04, 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Rashkova, B.; Moser, G.; Felber, H.; Grosinger, W.; Zhang, Z.; Motz, C.; Dehm, G.: A Novel Preparation Route to Obtain Micro-Bending Beams for In-situ TEM Studies. In: Instrumentation and Methodology, Vol. 1, pp. 249 - 250. 9th Multinational Microscopy Conference 2009, Institute for Electron Microscopy Graz, University of Technology , Graz, Austria, August 30, 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Kiener, D.; Jörg, T.; Rester, M.; Motz, C.; Dehm, G.: Conventional TEM Investigation of the FIB Damage in Copper. In: Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, pp. 100 - 101. 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, Saarbrücken, Germany, September 02, 2007 - September 07, 2007. (2007)

Kiener, D.; Motz, C.; Dehm, G.: In-Situ compression tests on micron-sized copper pillars. Meeting at Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, January 29, 2006., (2006)

Kirchlechner, C.; Imrich, P. J.; Micha, J.-S.; Ulrich, O.; Motz, C.: Study of fatigue damage evolution in micron sized bending beams by in situ µLaue diffraction. ICM12, Karlsruhe, Germany (2015)

Kirchlechner, C.; Motz, C.; Imrich, P. J.; Malyar, N.; Micha, J.-S.; Ulrich, O.; Dehm, G.: In situ micromechanics: An overview on µLaue based experiments to study GND accumulation in various loading geometries. International Symposium on Plasticity, Keynote lecture, Montego Bay, Jamaica (2015)

Imrich, P. J.; Kirchlechner, C.; Motz, C.; Jeon, J. B.; Dehm, G.: In Situ Electron Microscopy and Micro-Laue Study of Plasticity in Miniaturized Cu Bicrystals. CAMTEC III, Symposium on Fine-Scale Mechanical Characterisation and Behaviour , Cambridge, UK (2014)

Kirchlechner, C.; Dehm, G.; Motz, C.: µLaue: A novel view on fatigue damage at the micron scale. MRS Fall Meeting, Boston, MA, USA (2014)

Kirchlechner, C.; Imrich, P. J.; Motz, C.; Dehm, G.: Plastic deformation of bi-crystalline micro pillars analyzed by in situ µLaue diffraction. TMS2014, Annual Meeting & Exhibition, San Diego, CA, USA (2014)

Kirchlechner, C.; Motz, C.; Imrich, P. J.; Dehm, G.: A novel view on fatigue damage at the micron scale by in situ X-ray µLaue diffraction. TMS2014, San Diego, CA, USA (2014)

Kirchlechner, C.; Motz, C.; Kapp, M. W.; Dehm, G.: Reversible dislocation motion in micron sized bending beams during monotone and cyclic loading. PLASTICITY 2014, Free Port, Bahamas (2014)

Kirchlechner, C.; Liegl, W.; Motz, C.; Dehm, G.: X-ray μLaue: A novel view on fatigue damage at the micron scale. ECI on Nanomechanical Testing 2013, Olhão (Algarve), Portugal (2013)

Kirchlechner, C.; Motz, C.; Dehm, G.: A novel view on fatigue damage at the micron scale by X-ray µLaue diffraction. GDRi CNRS MECANO General Meeting on the Mechanics of Nano-Objects, MPIE, Düsseldorf, Germany (2013)

Dehm, G.; Imrich, P. J.; Kirchlechner, C.; Smolka, M.; Yang, B.; Motz, C.: In situ micro- and nanomechanical electron microscopy studies of grain boundaries in Cu. MRS Fall Meeting 2012, Boston, MA, USA (2012)

Rashkova, B.; Moser, G.; Felber, H.; Grosinger, W.; Zhang, Z.; Motz, C.; Dehm, G.: A Novel Preparation Route to Obtain Micro-Bending Beams for In-situ TEM Studies. 9th Multinational Microscopy Conference 2009, Institute for Electron Microscopy Graz University of Technology , Graz, Austria (2009)

Motz, C.; Kiener, D.; Schöberl, T.; Dehm, G.: Micron beam bending and compression tests - micromechanical properties of copper. 7th European Symposium on nano-mechanical testing, Hückelhoven, Germany (2006)