Abboud, A.; Kirchlechner, C.; Kečkéš, J.; Çonka-Nurdan, T.; Send, S.; Micha, J.-S.; Ulrich, O.; Hartmann, R.; Strüderf, L.; Pietsch, U.: Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a twodimensional energy-dispersive detector. Journal of Applied Crystallography 50 (3), pp. 901 - 908 (2017)

Holec, D.; Tasnádi, F.; Wagner, P.; Friák, M.; Neugebauer, J.; Mayrhofer, P. H.; Kečkéš, J.; Kečkéš, J.: Macroscopic elastic properties of textured ZrN–AlN polycrystalline aggregates. Physical Review B 90 (18), 184106 (2014)

Abboud, A.; Kirchlechner, C.; Send, S.; Micha, J.-S.; Ulrich, O.; Pashniak, N.; Strüder, L. W.; Kečkéš, J.; Pietsch, U.: A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device. Review of Scientific Instruments 85 (11), 113901 (2014)

Vaxelaire, N.; Labat, S.; Cornelius, T. W.; Kirchlechner, C.; Kečkéš, J.; Schulli, T. U.; Thomas, O.: New insights into single-grain mechanical behavior from temperature-dependent 3-D coherent X-ray diffraction. Acta Materialia 78, pp. 46 - 55 (2014)

Kirchlechner, C.; Grosinger, W.; Kapp, M. W.; Imrich, P. J.; Micha, J.-S.; Ulrich, O.; Kečkéš, J.; Dehm, G.; Motz, C.: Investigation of reversible plasticity in a micron-sized, single crystalline copper bending beam by X-ray μLaue diffraction. Philosophical Magazine 92 (25-27), pp. 3231 - 3242 (2012)

Kirchlechner, C.; Kečkéš, J.; Motz, C.; Grosinger, W.; Kapp, M. W.; Micha, J.-S.; Ulrich, O.; Dehm, G.: Impact of instrumental constraints and imperfections on the dislocation structure in micron-sized Cu compression pillars. Acta Materialia 59 (14), pp. 5618 - 5626 (2011)

Kirchlechner, C.; Kečkéš, J.; Micha, J.-S.; Dehm, G.: In Situ µLaue: Instrumental Setup for the Deformation of Micron Sized Samples. Advanced Engineering Materials 13 (8), pp. 837 - 844 (2011)

Kirchlechner, C.; Kiener, D.; Motz, C.; Labat, S.; Vaxelaire, N.; Perroud, O.; Micha, J.-S.; Ulrich, O.; Thomas, O.; Dehm, G. et al.; Kečkéš, J.: Dislocation storage in single slip-oriented Cu micro-tensile samples: New insights via X-ray microdiffraction. Philosophical Magazine 91 (7-9), pp. 1256 - 1264 (2011)

Kirchlechner, C.; Martinschitz, K. J.; Daniel, R.; Mitterer, C.; Donges, J.; Rothkirch, A.; Klaus, M.; Genzel, C.; Kečkéš, J.: X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel. Scripta Materialia 62 (10), pp. 774 - 777 (2010)

Vaxelaire, N.; Proudhon, H.; Labat, S.; Kirchlechner, C.; Kečkéš, J.; Jacques, V.; Ravy, S.; Forest, S.; Thomas, O.: Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction. New Journal of Physics 12, 035018, pp. 1 - 12 (2010)

Kirchlechner, C.; Martinschitz, K. J.; Daniel, R.; Klaus, M.; Genzel, C.; Mitterer, C.; Kečkéš, J.: Residual stresses and thermal fatigue in CrN hard coatings characterized by high-temperature synchrotron X-ray diffraction. Thin Solid Films 518 (8), pp. 2090 - 2096 (2010)

Vaxelaire, N.; Labat, S.; Chamard, V.; Thomas, O.; Jacques, V.; Picca, F. E.; Ravy, S.; Kirchlechner, C.; Kečkéš, J.: 3D strain imaging in sub-micrometer crystals using cross-reciprocal space measurements: Numerical feasibility and experimental methodology. Nuclear Instruments and Methods in Physics Research Section B 268 (3-4), pp. 388 - 393 (2010)

Kirchlechner, C.; Martinschitz, K. J.; Daniel, R.; Mitterer, C.; Kečkéš, J.: Residual stresses in thermally cycled CrN coatings on steel. Thin Solid Films 517 (3), pp. 1167 - 1171 (2008)

Rashkova, B.; Prantl, W.; Görgl, R.; Kečkéš, J.; Cohen, S. S.; Bamberger, M. S.; Dehm, G.: Precipitation processes in a Mg–Zn–Sn alloy studied by TEM and SAXS. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing 494 (1-2), pp. 158 - 165 (2008)

Kapp, M.; Martinschitz, K. J.; Kečkéš, J.; Lackner, J.M.; Zizak, I.; Dehm, G.: Thermal stresses and microstructure of tungsten films on copper. BHM Berg- und Hüttenmännische Monatshefte 153 (7), pp. 273 - 277 (2008)

Eiper, E.; Kečkéš, J.; Martinschitz, K. J.; Zizak, I.; Cabié, M.; Dehm, G.: Size-independent stresses in Al thin films thermally strained down to -100°C. Acta Materialia 55 (6), pp. 1941 - 1946 (2007)

Kečkéš, J.; Eiper, E.; Martinschitz, K. J.; Boesecke, P.; Gindl, W.; Dehm, G.: In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale. Advanced Engineering Materials 8 (11), pp. 1084 - 1088 (2006)

Kirchlechner, C.; Kečkéš, J.; Micha, J.-S.; Dehm, G.: In Situ μLaue: Instrumental Setup for the Deformation of Micron Sized Samples. In: Neutrons and Synchrotron Radiation in Engineering Materials Science: From Fundamentals to Applications: Second Edition, pp. 425 - 438 (Eds. Staron, P.; Schreyer, A.; Clemens, H.; Mayer, S.). wiley, Hoboken, NJ, USA (2017)

Martinschitz, K. J.; Kirchlechner, C.; Daniel, R.; Maier, G.; Mitterer, C.; Kečkéš, J.: Temperature dependence of residual stress gradients in shot-peened steel coated with CrN. International Conference on stress evaluation using neutrons and synchrotron radiation, MECA SENS IV, Vienna; Austria, September 24, 2007 - September 26, 2007. Materials Science Forum 571-572, pp. 101 - 106 (2008)

Eiper, E.; Martinschitz, K. J.; Dehm, G.; Kečkéš, J.: Size effect in metallic thin films characterized by low-temperature X-ray diffraction. Gordon Research Conference on thin film & smallscale mechanical behavior , Colby College Waterville, Maine, USA (2006)