Jörg, T.; Cordill, M. J.; Franz, R.; Kirchlechner, C.; Többens, D. M.; Winkler, J.; Mitterer, C.: Thickness dependence of the electro-mechanical response of sputter deposited Mo thin films on polyimide: Insights from in situ synchrotron diffraction tensile tests. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing 697, pp. 17 - 23 (2017)

Zhang, Z.; Long, Y.; Cazottes, S.; Daniel, R.; Mitterer, C.; Dehm, G.: The peculiarity of the metal-ceramic interface. Scientific Reports 5, 11460 (2015)

Kirchlechner, C.; Martinschitz, K. J.; Daniel, R.; Mitterer, C.; Donges, J.; Rothkirch, A.; Klaus, M.; Genzel, C.; Kečkéš, J.: X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel. Scripta Materialia 62 (10), pp. 774 - 777 (2010)

Kirchlechner, C.; Martinschitz, K. J.; Daniel, R.; Klaus, M.; Genzel, C.; Mitterer, C.; Kečkéš, J.: Residual stresses and thermal fatigue in CrN hard coatings characterized by high-temperature synchrotron X-ray diffraction. Thin Solid Films 518 (8), pp. 2090 - 2096 (2010)

Dehm, G.; Wörgötter, H. P.; Cazottes, S.; Purswani, J. M.; Gall, D.; Mitterer, C.; Kiener, D.: Can micro-compression testing provide stress–strain data for thin films? A comparative study using Cu, VN, TiN and W coatings. Thin Solid Films 518 (5), pp. 1517 - 1521 (2009)

Kirchlechner, C.; Martinschitz, K. J.; Daniel, R.; Mitterer, C.; Kečkéš, J.: Residual stresses in thermally cycled CrN coatings on steel. Thin Solid Films 517 (3), pp. 1167 - 1171 (2008)

Lazar, P.; Rashkova, B.; Redinger, J.; Podloucky, R.; Mitterer, C.; Scheu, C.; Dehm, G.: Interface structure of epitaxial (111) VN films on (111) MgO substrates. Thin Solid Films 517 (3), pp. 1177 - 1181 (2008)

Lazar, P.; Redinger, J.; Strobl, J.; Podloucky, R.; Rashkova, B.; Dehm, G.; Kothleitner, G.; Šturm, S.; Kutschej, K.; Mitterer, C. et al.; Scheu, C.: N–K electron energy-loss near-edge structures for TiN/VN layers: an ab initio and experimental study. Analytical and Bioanalytical Chemistry 390 (6), pp. 1447 - 1453 (2008)

Kutschej, K.; Rashkova, B.; Shen, J.; Edwards, D.; Mitterer, C.; Dehm, G.: Experimental studies on epitaxially grown TiN and VN films. Thin Solid Films 516 (2-4), pp. 369 - 373 (2007)

Rashkova, B.; Lazar, P.; Redinger, J.; Podloucky, R.; Kothleitner, G.; Šturm, S.; Kutschej, K.; Mitterer, C.; Scheu, C.; Dehm, G.: Combined ab-initio and N–K, Ti-L_2,3, V-L_2,3 electron energy-loss near edge structure studies for TiN and VN films. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques 98 (11), pp. 1060 - 1065 (2007)

Dehm, G.; Motz, C.; Scheu, C.; Clemens, H. J.; Mayrhofer, P. H.; Mitterer, C.: Mechanical size-effects in miniaturized and bulk materials. Advanced Engineering Materials 8 (11), pp. 1033 - 1045 (2006)

Rashkova, B.; Zhang, Z.; Šturm, S.; Kothleitner, G.; Kutschej, K.; Mitterer, C.; Lazar, P.; Redinger, J.; Podloucky, R.; Scheu, C. et al.; Dehm, G.: EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates. In: 9th Multinational Microscopy Conference 2009, pp. 285 - 286 (Ed. Kothleitner, G.). 9th Multinational Microscopy Conference 2009, Graz, Austria, August 30, 2009 - September 04, 2008. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Martinschitz, K. J.; Kirchlechner, C.; Daniel, R.; Maier, G.; Mitterer, C.; Kečkéš, J.: Temperature dependence of residual stress gradients in shot-peened steel coated with CrN. International Conference on stress evaluation using neutrons and synchrotron radiation, MECA SENS IV, Vienna; Austria, September 24, 2007 - September 26, 2007. Materials Science Forum 571-572, pp. 101 - 106 (2008)

Rashkova, B.; Kothleitner, G.; Šturm, S.; Scheu, C.; Kutschej, K.; Mitterer, C.; Lazar, P.; Redinger, J.; Podloucky, R.; Dehm, G.: A Comparison of the Electronic Structure of N–K in TiN and VN using EELS and Ab-initio Calculations. In: Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, pp. 414 - 415. Microscopy 33rd Conference, Deutsche Gesellschaft für Elektronenmikroskopie, Saarbrücken, Germany, September 02, 2007 - September 07, 2007. (2007)