Publications of Baptiste Gault

Hachet, G.; Tehranchi, A.; Shi, H.; Prabhakar, J. M.; Wei, S.; Angenendt, K.; Zaefferer, S.; Gault, B.; Sun, B.; Ponge, D. et al.; Raabe, D.: Segregation at prior austenite grain boundaries: The competition between boron and hydrogen. International Journal of Hydrogen Energy 95, pp. 734 - 746 (2024)

Gabriel, P.; Nallathambi, V.; Liu, J.; Staab, F.; Oyedeji, T.; Yang, Y.; Hantke, N.; Adabifiroozjaei, E.; Recalde-Benitez, O.; Molina-Luna, L. et al.; Rao, Z.; Gault, B.; Sehrt, J.; Scheibel, F.; Skokov, K.; Xu, B.-X.; Durst, K.; Gutfleisch, O.; Barcikowski, S.; Ziefuss, A.: Boosting Coercivity of 3D Printed Hard Magnets through Nano-Modification of the Powder Feedstock. Advanced Science 11 (46), 2407972 (2024)

Johansen, M.; Singh, M. P.; Gault, B.; Liu, F.: Suppressing Lithium Migration in a Carbon Fiber Negative Electrode During Atom Probe Tomography Analysis. Microscopy and Microanalysis 30 (6), pp. 1066 - 1073 (2024)

Knowles, A. J.; Cheung, T. Y. S.; Ma, K.; Dodds, R.; Humphry-Baker, S. A.; Ferraz Morgado, F.; Morgado, F. F.; Katnagallu, S.; Saiz, E.; Gault, B. et al.; Hardie, C. D.; Dye, D.: Spinodally reinforced W–Cr fusion armour. Applied Materials Today 41, 102430 (2024)

Tegg, L.; McCarroll, I.; Kim, S.-H.; Dubosq, R.; Woods, E.; El-Zoka, A.; Gault, B.; Cairney, J.: Analysis of Water Ice in Nanoporous Copper Needles Using Cryo Atom Probe Tomography. Microscopy and Microanalysis 30 (6), pp. 1195 - 1204 (2024)

Chakrabartty, S.; Parse, H.; Krämer, M.; Kim, S.-H.; Raabe, D.; Gault, B.; Sokol, M.; Rosen, B.; Eliaz, N.: Ti₃C₂T_z Supported Pulse-Electrodeposited Pt Nanostructures for Enhanced Acidic Electrochemical Hydrogen Evolution. ChemCatChem 16 (22), e202401088 (2024)

Wang, C.; Wang, L.; Nallathambi, V.; Liu, Y.; Kresse, J.; Hübner, R.; Reichenberger, S.; Gault, B.; Zhan, J.; Eychmüller, A. et al.; Cai, B.: Structural Regulation of Au-Pt Bimetallic Aerogels for Catalyzing the Glucose Cascade Reaction. Advanced Materials 36 (41), 2405200 (2024)

Geng, X.; Vega-Paredes, M.; Wang, Z.; Ophus, C.; Lu, P.; Ma, Y.; Zhang, S.; Scheu, C.; Liebscher, C.; Gault, B.: Grain boundary engineering for efficient and durable electrocatalysis. Nature Communications 15, 8534 (2024)

Yu, J.; Wang, Z.; Saksena, A.; Wei, S.; Wei, Y.; Colnaghi, T.; Marek, A.; Rampp, M.; Song, M.; Gault, B. et al.; Li, Y.: 3D deep learning for enhanced atom probe tomography analysis of nanoscale microstructures. Acta Materialia 278, 120280 (2024)

Gault, B.; Saksena, A.; Sauvage, X.; Bagot, P.; Aota, L. S.; Arlt, J.; Belkacemi, L. T.; Boll, T.; Chen, Y.-S.; Daly, L. et al.; Djukic, M.; Douglas, J.; Duarte, M. J.; Felfer, P. J.; Forbes, R.; Fu, J.; Gardner, H.; Gemma, R.; Gerstl, S. S. A.; Gong, Y.; Hachet, G.; Jakob, S.; Jenkins, B. M.; Jones, M. E.; Khanchandani, H.; Kontis, P.; Krämer, M.; Kühbach, M.; Marceau, R. K. W.; Mayweg, D.; Moore, K.; Nallathambi, V.; Ott, B.; Poplawsky, J. D.; Prosa, T.; Pundt, A.; Saha, M.; Schwarz, T.; Shang, Y.; Shen, X.; Vrellou, M.; Yu, Y.; Zhao, Y.; Zou, B.: Towards Establishing Best Practice in the Analysis of Hydrogen and Deuterium by Atom Probe Tomography. Microscopy and Microanalysis 30 (6), pp. 1205 - 1220 (2024)

Torkornoo, S.; Bohner, M.; McCarroll, I.; Gault, B.: Optimization of Parameters for Atom Probe Tomography Analysis of β-Tricalcium Phosphates. Microscopy and Microanalysis 30 (6), pp. 1074 - 1082 (2024)

Li, Y.; Colnaghi, T.; Gong, Y.; Zhang, H.; Yu, Y.; Wei, Y.; Gan, B.; Song, M.; Marek, A.; Rampp, M. et al.; Zhang, S.; Pei, Z.; Wuttig, M.; Ghosh, S.; Körmann, F.; Neugebauer, J.; Wang, Z.; Gault, B.: Machine Learning-Enabled Tomographic Imaging of Chemical Short-Range Atomic Ordering. Advanced Materials 36 (44), 2407564 (2024)

Schwarz, T.; Yang, J.; Aota, L. S.; Woods, E.; Zhou, X.; Neugebauer, J.; Todorova, M.; McCarroll, I.; Gault, B.: Quasi-“In Situ” Analysis of the Reactive Liquid-Solid Interface during Magnesium Corrosion Using Cryo-Atom Probe Tomography. Advanced Materials 36 (32), 2401735 (2024)

Li, Y.; Gault, B.: Machine Learning Enhanced Tomographic Imaging of Chemical Short-range Order in Fe-based Solid Solutions. Microscopy and Microanalysis 30 (Supplement_1), pp. 44 - 45 (2024)

Topore, G.; Keeney, L.; Ramasse, Q.; Griffin, S.; Gault, B.; Conroy, S.: Probing Sub-Unit Cell Polarization Waves in Multiferroic Layered Oxides with EELS. Microscopy and Microanalysis 30 (Supplement_1), ozae044.749 (2024)

Bauer, S.; Benner, P.; Bereau, T.; Blum, V.; Boley, M.; Carbogno, C.; Catlow, C. R. A.; Dehm, G.; Eibl, S.; Ernstorfer, R. et al.; Fekete, A.; Foppa, L.; Fratzl, P.; Freysoldt, C.; Gault, B.; Ghiringhelli, L. M.; Giri, S. K.; Gladyshev, A.; Goyal, P.; Hattrick-Simpers, J.; Kabalan, L.; Karpov, P.; Khorrami, M. S.; Koch, C.; Kokott, S.; Kosch, T.; Kowalec, I.; Kremer, K.; Leitherer, A.; Li, Y.; Liebscher, C.; Logsdail, A. J.; Lu, Z.; Luong, F.; Marek, A.; Merz, F.; Mianroodi, J. R.; Neugebauer, J.; Pei, Z.; Purcell, T.; Raabe, D.; Rampp, M.; Rossi, M.; Rost, J.-M.; Saal, J. E.; Saalmann, U.; Sasidhar, K. N.; Saxena, A.; Sbailo, L.; Scheidgen, M.; Schloz, M.; Schmidt, D. F.; Teshuva, S.; Trunschke, A.; Wei, Y.; Weikum, G.; Xian, R. P.; Yao, Y.; Yin, J.; Zhao, M.; Scheffler, M.: Roadmap on Data-Centric Materials Science. Modelling and Simulation in Materials Science and Engineering 32 (6), 063301 (2024)

Dubosq, R.; Woods, E.; Gault, B.; Best, J. P.: Correction: Electron microscope loading and in situ nanoindentation of water ice at cryogenic temperatures. PLOS ONE 19 (6), e0306374 (2024)

Woods, E.; Saksena, A.; El-Zoka, A.; Stephenson, L.; Schwarz, T.; Singh, M. P.; Aota, L. S.; Kim, S.-H.; Schneider, J.; Gault, B.: Nanoporous Gold Thin Films as Substrates to Analyze Liquids by Cryo-atom Probe Tomography. Microscopy and Microanalysis 30 (6), pp. 1172 - 1180 (2024)

Heuser, D.; Dubosq, R.; Petrishcheva, E.; Bian, G.; Rentenberger, C.; Lengauer, C.; Gault, B.; Habler, G.; Abart, R.: Coherent solvus of disordered alkali feldspar: experiment, atom probe tomography and thermodynamic model. Contributions to Mineralogy and Petrology 179 (6), 68 (2024)

Kraemer, M.; Favelukis, B.; Sokol, M.; Rosen, B. A.; Eliaz, N.; Kim, S.-H.; Gault, B.: Facilitating Atom Probe Tomography of 2D MXene Films by In Situ Sputtering. Microscopy and Microanalysis 30 (6), pp. 1057 - 1065 (2024)