Choi, P.: Characterization of CuInSe2 and CuInGaSe2 thin-film solar cells using Atom Probe Tomography. International Conference on Electronic Materials and Nanotechnology for Green Environemnt, Jeju Island, South Korea (2010)
Cojocaru-Mirédin, O.; Choi, P.; Wuerz, R.; Raabe, D.: Atomic-scale distribution of impurities in CuInSe2-based thin-film solar cells. 52nd International Field Emission Symposium IFES 2010, Sydney, Australia (2010)
Dmitrieva, O.; Choi, P.; Ponge, D.; Raabe, D.; Gerstl, S. S. A.: Laser-pulsed atom probe studies of a complex maraging steel: Laser pulse energy variation and precipitate analysis. 52nd International Field Emission Symposium IFES 2010, Sydney, Australia (2010)
Li, Y. J.; Choi, P.; Borchers, C.; Chen, Y.Z.; Goto, S.; Raabe, D.; Kirchheim, R.: Atom Probe Tomography characterization of heavily cold drawn pearlitic steel wire. 52nd International Field Emission Symposium (IFES), Sydney, Australia (2010)
Raabe, D.; Li, Y. J.; Choi, P.; Sauvage, X.; Kirchheim, R.; Hono, K.: Atomic-scale mechanisms in mechanical alloying - Towards the limits of strength in ductile nano-structured bulk materials. International Symposium on Metastable, Amorphous and Nanostructured Materials (ISMANAM) 2010, ETH Zürich, Switzerland (2010)
Cojocaru-Mirédin, O.; Choi, P.; Wuerz, R.; Raabe, D.: Atomic-scale distribution of impurities in CuInSe2-based thin-film solar cells. 15th GLADD meeting 2010, Delft, The Netherlands (2010)
Cojocaru-Mirédin, O.; Choi, P.; Wuerz, R.; Liu, T.; Raabe, D.: Characterization of CuInSe2 and Cu(In,Ga)Se2 thin-film solar cells using Atom Probe Tomography. Zentrum für Sonnenenergie und Wasserstoffforschung (ZSW), Stuttgart, Germany (2010)
Jun, H.; Choi, P.-P.; Li, Z.; Raabe, D.: Design of dual-phase refractory multi-principle element alloys. 2nd International Conference on High-Entropy Materials (ICHEM 2018), Jeju, South Korea (2018)
Cojocaru-Mirédin, O.; Schwarz, T.; Choi, P.; Würz, R.; Raabe, D.: Characterization of Cu(In,Ga)Se2 grain boundaries using atom probe tomography. 2013 MRS Spring Meeting & Exhibit, San Francisco, CA, USA (2013)
Herbig, M.; Choi, P.; Raabe, D.: A Sample Holder System that Enables Sophisticated TEM Analysis of APT Tips. International Field Emission Symposium 2012, Tuscaloosa, AL, USA (2012)
Cojocaru-Mirédin, O.; Choi, P.; Wuerz, R.; Raabe, D.: Atomic-scale analysis of the p-n junction in CI(G)S thin-film solar cells. Euromat 2011, Montpellier, France (2011)
Choi, P.: Nanoscale characterization of TiAlN/CrN multilayer hardcoatings. 5th International Union of Microbeam Analysis Societies meeting, Seoul, South Korea (2011)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Atom probe tomography (APT) is one of the MPIE’s key experiments for understanding the interplay of chemical composition in very complex microstructures down to the level of individual atoms. In APT, a needle-shaped specimen (tip diameter ≈100nm) is prepared from the material of interest and subjected to a high voltage. Additional voltage or laser…
Ever since the discovery of electricity, chemical reactions occurring at the interface between a solid electrode and an aqueous solution have aroused great scientific interest, not least by the opportunity to influence and control the reactions by applying a voltage across the interface. Our current textbook knowledge is mostly based on mesoscopic…
Recent developments in experimental techniques and computer simulations provided the basis to achieve many of the breakthroughs in understanding materials down to the atomic scale. While extremely powerful, these techniques produce more and more complex data, forcing all departments to develop advanced data management and analysis tools as well as…
Integrated Computational Materials Engineering (ICME) is one of the emerging hot topics in Computational Materials Simulation during the last years. It aims at the integration of simulation tools at different length scales and along the processing chain to predict and optimize final component properties.