Conference Paper
Elhami, N.; Tasan, C. C.; Zaefferer, S.: Quantitative defect analysis using electron channeling contrast imaging under controlled diffraction conditions (cECCI). In: Proceedings of M&M 2012, pp. 690 - 691 (Eds. Shields, J.; McKernan, S.; Brewer, L.; Ruiz, T.; Turnquist, D.). Microscopy & Microanalysis 2012, Phoenix, AZ, USA, July 29, 2012 - August 02, 2012. Microscopy Society of America (2012)