© Max-Planck-Institut für Eisenforschung GmbH

Publications of Rajib Sahu

Journal Article (9)

1.
Journal Article
Dey, A.; Sil, S.; Majumdar, S.; Sahu, R.; Ghosh, M.; Lepcha, G.; Ray, P. P.; Dey, B.: Exploring the studies of charge transportation of an aromatic acid based Co(II)-Metallogel scaffold fabricated Schottky device. Journal of Physics and Chemistry of Solids 160, 110300 (2022)
2.
Journal Article
Majumdar, S.; Sil, S.; Sahu, R.; Ghosh, M.; Lepcha, G.; Dey, A.; Mandal, S.; Pratim Ray, P.; Dey, B.: Electronic charge transport phenomena directed smart fabrication of Metal-Semiconductor based electronic junction device by a supramolecular Mn(II)-Metallogel. Journal of Molecular Liquids 338, 116769 (2021)
3.
Journal Article
Völker, B.; Stelzer, B.; Mráz, S.; Rueß, H.; Sahu, R.; Kirchlechner, C.; Dehm, G.; Schneider, J. M.: On the fracture behavior of Cr2AlC coatings. Materials and Design 206, 109757 (2021)
4.
Journal Article
Majumdar, S.; Dey, A.; Sahu, R.; Dhibar, S.; Ray, P. P.; Dey, B.: Cd-Based Metallohydrogel Composites with Graphene Oxide, MoS2, MoSe2, and WS2 for Semiconducting Schottky Barrier Diodes. ACS Applied Nano Materials 3 (11), pp. 11025 - 11036 (2020)
5.
Journal Article
Lim, J.; Kasiri, G.; Sahu, R.; Schweinar, K.; Hengge, K. A.; Raabe, D.; La Mantia, F.; Scheu, C.: Irreversible Structural Changes of Copper Hexacyanoferrate used as Cathode in Zn‐Ion Batteries. Chemistry – A European Journal 26 (22), pp. 4917 - 4922 (2020)
6.
Journal Article
Kim, S.-H.; Lim, J.; Sahu, R.; Kasian, O.; Stephenson, L.; Scheu, C.; Gault, B.: Direct Imaging of Dopant and Impurity Distributions in 2D MoS2. Advanced Materials 32 (8), 1907235 (2020)
7.
Journal Article
Sahu, R.: Two-Dimensional MoS2 and Heterostructure Growth by Pulsed Laser Deposition. Modern Concepts in Material Science 2 (2), pp. 1 - 3 (2019)
8.
Journal Article
Stelzer, B.; Chen, X.; Bliem, P.; Hans, M.; Völker, B.; Sahu, R.; Scheu, C.; Primetzhofer, D.; Schneider, J. M.: Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity Measurements. Scientific Reports 9, 8266 (2019)
9.
Journal Article
Achenbach, J.-O.; Sahu, R.; Völker, B.; Hans, M.; Primetzhofer, D.; Miljanovic, D. J.; Scheu, C.; Schneider, J. M.: Synthesis and Properties of Orthorhombic MoAlB Coatings. Coatings 9 (8), 510 (2019)

Talk (3)

10.
Talk
Gault, B.; Kim, S.-H.; Lim, J.; El-Zoka, A.; Kasian, O.; Sahu, R.; Stephenson, L.; Scheu, C.: Nanoparticle Specimen Preparation for Atom Probe: Chemical Fixation and… cryo-Fixation (?). TMS 2020 Annual Meeting & Exhibition, San Diego, CA, USA (2020)
11.
Talk
Sahu, R.: Study of phase impurity, 2D and 3D defects in orthorhombic MoAlB MAB phase. Advances in Correlative Microscopy Workshop, IIT Madras, Chennai, India (2020)
12.
Talk
Lim, J.; Kim, S.-H.; Sahu, R.; Aymerich Armengol, R.; Kasian, O.; Choi, P.-P.; Stephenson, L.; Gault, B.; Scheu, C.: Detection of trace impurities and other defects in functional nanomaterials. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano 2019, Düsseldorf, Germany (2019)

Poster (4)

13.
Poster
Lim, J.; Sahu, R.; Schweinar, K.; Kasiri, G.; Hengge, K. A.; Raabe, D.; La Mantia, F.: Phase Transformation of Copper Hexacyanoferrate Cathode in Aqueous Zn-Ion Battery. 2019 MRS Fall Meeting , Boston, MA, USA (2019)
14.
Poster
Sahu, R.; Singh Negi, D.; Scheu, C.: Local strain field in distorted 1T (1Td) MoS2 phases by GPA. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano 2019, Düsseldorf, Germany (2019)
15.
Poster
Sahu, R.; Völker, B.; Achenbach, J.-O.; Hans, M.; Primetzhofer, D.; Miljanovic, D. J.; Schneider, J. M.; Scheu, C.: Microscopic study of a low temperature synthesized MoAlB coating by combinatorial direct current magnetron sputtering. Microscopy Conference, MC 2019, Berlin, Germany (2019)
16.
Poster
Sahu, R.; Völker, B.; Stelzer , B.; Chen, X.; Bliem , P.; Hans, M.; Primetzhofer, D.; Schneider, J. M.; Scheu, C.: Phase transitions in Cr2AlC thin films by in situ TEM heating experiment. Fifth Conference on Frontiers of Aberration Corrected Electron Microscopy, PICO 2019, Vaalsbroek, The Netherlands (2019)
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