Publications of Lars Hoffmann

Mehrtens, T.; Schowalter, M.; Tytko, D.; Choi, P.-P.; Raabe, D.; Hoffmann, L.; Jönen, H.; Rossow, U.; Hangleiter, A.; Rosenauer, A.: Measurement of the indium concentration in high indium content InGaN layers by scanning transmission electron microscopy and atom probe tomography. Applied Physics Letters 102 (13), 132112 (2013)

Mehrtens, T.; Schowalter, M.; Tytko, D.; Choi, P.-P.; Raabe, D.; Hoffmann, L.; Jönen, H.; Rossow, U.; Hangleiter, A.; Rosenauer, A.: Measuring composition in InGaN from HAADF-STEM images and studying the temperature dependence of Z-contrast. In: Journal of Physics: Conference Series, Vol. 471, 012009. 18th Microscopy of Semiconducting Materials Conference, MSM 2013, Oxford, UK, April 07, 2013 - April 11, 2013. (2013)