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Publications of Vivek Devulapalli

Journal Article (4)

Journal Article
Devulapalli, V.; Hans, M.; Prithiv, T. S.; Schneider, J. M.; Dehm, G.; Liebscher, C.: Microstructure, grain boundary evolution and anisotropic Fe segregation in (0001) textured Ti thin films. Acta Materialia 238, 118180 (2022)
Journal Article
Wu, G.; Liu, C.; Brognara, A.; Ghidelli, M.; Bao, Y.; Liu, S.; Wu, X.; Xia, W.; Zhao, H.; Rao, J. et al.; Ponge, D.; Devulapalli, V.; Lu, W.; Dehm, G.; Raabe, D.; Li, Z.: Symbiotic crystal-glass alloys via dynamic chemical partitioning. Materials Today 51, pp. 6 - 14 (2021)
Journal Article
Vasileiadis, I. G.; Lymperakis, L.; Adikimenakis, A.; Gkotinakos, A.; Devulapalli, V.; Liebscher, C.; Androulidaki, M.; Hübner, R.; Karakostas, T.; Georgakilas, A. I. et al.; Komninou, P.; Dimakis, E.; Dimitrakopulos, G. P.: Substitutional synthesis of sub-nanometer InGaN/GaN quantum wells with high indium content. Scientific Reports 11 (1), 20606 (2021)
Journal Article
Devulapalli, V.; Bishara, H.; Ghidelli, M.; Dehm, G.; Liebscher, C.: Influence of substrates and e-beam evaporation parameters on the microstructure of nanocrystalline and epitaxially grown Ti thin films. Applied Surface Science 562, 150194 (2021)

Talk (1)

Devulapalli, V.; Dehm, G.; Liebscher, C.: Unravelling grain boundary structures in Ti thin films using aberration-corrected transmission electron microscopy. MSE Darmdtadt (Virtual), Darmstadt, Germany (2020)

Poster (3)

Devulapalli, V.; Hans, M.; Prithiv, T. S.; Schneider, J. M.; Dehm, G.; Liebscher, C.: Unravelling the atomic structure and segregation of Ʃ13 [0001] tilt grain boundaries in titanium by advanced STEM. Microscopy Conference 2021 & Multinational Conference on Microscopy 2021, Vienna, Austria (2021)
Devulapalli, V.; Hans, M.; Schneider, J. M.; Dehm, G.; Liebscher, C.: Atomic structure and Fe-segregation in Ʃ13 [0001] Titanium tilt grain boundaries. PICO 2021 (Virtual) (2021)
Devulapalli, V.; Frommeyer, L.; Ghidelli, M.; Liebscher, C.; Dehm, G.: From epitaxially grown thin films to grain boundary analysis in Cu and Ti. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano, Düsseldorf, Germany (2019)

Thesis - PhD (1)

Thesis - PhD
Devulapalli, V.: Microstructure and grain boundary evolution in titanium thin films. Dissertation, Ruhr-Universität Bochum (2022)
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